MIURA Naruhisa | Tokyo Institute of Technology
スポンサーリンク
概要
関連著者
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SHIRAKASHI Jun-ichi
Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technology
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MIURA Naruhisa
Tokyo Institute of Technology
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Konagai Makoto
Tokyo Inst. Technol. Tokyo Jpn
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Matsumoto Kazuhiko
Electrotechnical Laboratory
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KONAGAI Makoto
Tokyo Institute of Technology
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Matsumoto K
Electrotechnical Lab. Ibaraki‐kenn Jpn
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Matsumoto Kazuhiko
Electrotechnical Laboratory (etl)
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Matsumoto Kazuhiko
Advanced Industrial Science And Technology:tsukuba University:crest
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Konagai Makoto
Department Of Electrical And Electronic Engineering. Tokyo Institute Of Technology
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Miura Naruhisa
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Matsumoto Kazuhiko
Electrotechnical Laboratory (elt)
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Matsumoto Kazuhisa
Sumitomo Electric Industries Ltd.
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Konagai M
Department Of Physical Electronics Tokyo Institute Of Technology
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Miura N
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Shirakashi Junichi
Electrotechnical Laboratory
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Shirakashi Jun-ichi
Electrotechnical Laboratory
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Matsumoto K
Nippon Sanso Corp. Ibaraki Jpn
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Matsumoto K
Advanced Industrial Science And Technology:tsukuba University:crest
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Miura N
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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Matsumoto Koh
Tsukuba Laboratories Nippon Sanso Corporation
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Matsumoto K
Electrotechnical Laboratory
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ISHII Makoto
Optoelectronics Joint Research Laboratory
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Ishii Masami
Electrotechnical Laboratory
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Ishii M
Electrotechnical Laboratory
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Ishii M
Optoelectronics Joint Research Laboratory
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Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
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Ishii M
Liquid Crystal Lab. Sharp Corp.
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Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
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Ishii M
Shonan Inst. Technol. Kanagawa Jpn
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Miura Naruhisa
Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152, Japan
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Konagai Makoto
Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152, Japan
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Shirakashi Jun-ichi
Electrotechnical Laboratory (ETL), 1-1-4 Umezono, Tsukuba-shi, Ibaraki 305, Japan
著作論文
- Surface Modification of Niobium (Nb) by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)
- Room Temperature Nb-Based Single-Electron Transistors
- Room Temperature Nb-Based Single-Electron Transistors
- Single-Electron Transistors (SETs) with Nb/Nb Oxide System Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Nb/Nb Oxide-based Planar-Type Metal/Insulator/Metal (MIM) Diodes Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Room Temperature Nb-Based Single-Electron Transistors