In Situ Monitoring of Optical Reflectance Oscillation in Layer-by-Layer Chemical Vapor Deposition of Oxide Superconductor Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-09-01
著者
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小田 俊理
東工大工
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ODA Shunri
Department of Physical Electronics and Quantum Nanoelectronics Research Center, Tokyo Institute of T
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小田 俊理
東京工業大学量子ナノエレクトロニクス研究センター
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Sakai Kenji
Department of Plant Resources, Kyushu University
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Oda S
Tokyo Inst. Technol. Tokyo Jpn
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Oda Shunri
Research Center For Quantum Effect Electronics And Department Of Physical Electronics Tokyo Institut
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Oda Shunri
The Graduate School At Nagatsuta Tokyo Institute Of Technology
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ZAMA Hideaki
Department of Physical Electronics, Tokyo Institute of Technology
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Sakai Kiyomi
Kansai Advanced Research Center Communications Research Laboratory The Ministry Of Posts And Telecom
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Oda Shunri
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Sakai K
宮崎大
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Zama Hideaki
Department Of Electrical And Electronic Engineering Musashi Institute Of Technology
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Sakai Kenji
Department Of Environmental Chemistry And Engineering Faculty Of Engineering Oita University
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Sakai Kenji
Department Of Applied Chemistry Faculty Of Engineering Oita University
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