Evaluation of Deep States in Amorphous-Silicon / Silicon-Nitride System from Charge-Coupled Device Characteristics : Semiconductors and Semiconductors Devices
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1988-07-20
著者
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ODA Shunri
Department of Physical Electronics and Quantum Nanoelectronics Research Center, Tokyo Institute of T
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NAKAMURA Satoshi
Department of Neurosurgery, Tokyo Women's Medical University
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Sekine Satoshi
Department Of Cardiovascular Surgery Akita University School Of Medicine
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Sekine Satoshi
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Matsumura Masakiyo
Department of Physical Electronics, Tokyo Institute of Technology
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Matsumura Masakiyo
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Oda Shunri
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Nakamura Satoshi
Department Of Botany Graduate School Of Science Kyoto University
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Nakamura Satoshi
Department Of Bioengineering Tokyo Institute Of Technology
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Nakamura Satoshi
Department Of Acoustic And Speech Research Advance Telecommunications Research Institute International
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