Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-02-28
著者
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ODA Shunri
Department of Physical Electronics and Quantum Nanoelectronics Research Center, Tokyo Institute of T
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Oda Shunri
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
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Tsukiui Tetsuya
Department of Physical Electronics, Tokyo Institute of Technology
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Tsukiui Tetsuya
Department Of Physical Electronics Tokyo Institute Of Technology
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