Sputtering Yields of Si and Ni from the Ni_<1-x>Si_x System Studied by Rutherford Backscattering Spectrometry
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1982-01-05
著者
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HIRAKI Akio
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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YAMAGUCHI Satoru
Department of Life Science, Faculty of Science, Himeji Institute of Technology
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Kim Su
Department Of Pathology Dong-a University College Of Medicine
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SATOU Mamoru
Government Industrial Research Institute
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Hiraki Akio
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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Fujimoto Fuminori
College of General Education, University of Tokyo
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Kim Su
Department Of Electrical Engineering Osaka University
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KATAOKA Yoshihide
Department of Electrical Engineering, Osaka University
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IWAMI Motohiro
Department of Electrical Engineering, Osaka University
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Hiraki Akio
The University Of Electro-communications
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Kim Su
Department Of Agricultural Chemistry And Research Center For New Bio-materials In Agriculture Seoul
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Satou Mamoru
Goverment Industrial Research Institute
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Iwami Motohiro
Department Of Electrical Engineering Osaka University
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Iwami Motohiro
Faculty Of Engineering Osaka University
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Iwami Motohiro
Department Of Electrical Engineering Kyoto University:(present Address) Department Of Electrical Eng
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Kataoka Yoshihide
Department Of Electrical Engineering Osaka University
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HORIIKE Akio
The University of Electro-Communications
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Fujimoto Fuminori
College Of General Education University Of Tokyo
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Yamaguchi Satoru
Department Of Applied Physics Faculty Of Engineering Hokkaido University
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Yamaguchi Satoru
Department Of Electrical Engineering Osaka University
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Fujimoto Fuminori
College of Arts and Sciences,University of Tokyo
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FUJIMOTO Fuminori
College of Arts and Sciences, University of Tokyo:(Present address)Institute of Scientific and Industrial Research, Osaka University
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