Adsorption of H on the Ge/Si(001) Surface as Studied by Time-of-Flight Elastic Recoil Detection Analysis and Coaxial Impact Collision Ion Scattering Spectroscopy

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1999-03-15

著者

• KATAYAMA Mitsuhiro

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• OURA Kenjiro

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• Oura K

  Research Center For Ultrahigh Voltage Electron Microscopy Osaka University

• Katayama Mitsuhiro

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• Ryu Jeong-tak

  Faculty Of Computer & Communication Engineering Taegu University

• RYU Jeong-Tak

  Department of Computer and Communication Engineering Taegu University

• Ryu Jeong-tak

  Department Of Computer And Communication Engineering Daegu University

• FUSE Takashi

  Department of Electrical and Electronic Engineering, Faculty of Engineering, Tokyo Institute of Tech

• FUJINO Toshiaki

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• INODZUKA Katsuhiko

  Department of Electronic Engineering, Faculty of Engineering, Osaka University

• Inodzuka Katsuhiko

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• Fuse T

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• Fuse Takashi

  Department Of Electrical And Electronic Engineering Faculty Of Engineering Tokyo Institute Of Techno

• Fujino Takahiro

  Research Institute For Advanced Science And Technology Osaka Prefecture University

• Oura Kenjiro

  Department Of Elecronic Engineering Graduate School Of Engineering Osaka University

• Fujino Toshiaki

  Department of Elecronic Engineering, Graduate School of Engineering, Osaka University

• Katayama Mitsuhiro

  Department of Elecronic Engineering, Graduate School of Engineering, Osaka University

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