Electronic Transport in Multiwalled Carbon Nanotubes Contacted with Patterned Electrodes
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概要
- 論文の詳細を見る
The electrical conductance of $0.8\sim5$-μm-long multiwalled carbon nanotubes (MWCNT) was measured at room temperature in a multiprobe scanning tunneling microscope (STM)-scanning electron microscope (SEM) system and a conventional prober system, by bringing the MWCNTs into contact with patterned metal electrodes. The contact resistance between the CNTs and metal electrodes was sufficiently small. The conductance was proportional to $A/L$ (and also to $B/L$, within our experimental error), where $A$, $B$, and $L$ are the cross section, circumference, and length of CNTs. This indicates the occurrence of diffusive transport. A nonlinear current-voltage characteristic was obtained; the conductance increased steeply with current. A multiprobe STM-SEM system was very useful for measuring individual CNTs.
- 2004-08-15
著者
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Honda Shin-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Katayama Mitsuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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YOSHIMOTO Shinya
Department of Physics, School of Science, University of Tokyo
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HOBARA Rei
Department of Physics, School of Science, University of Tokyo
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Wongwiriyapan Winadda
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Ikuno Takashi
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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Hasegawa Shuji
Department Of Physics Faculty Of Science University Of Tokyo:(present Adress) Advanced Research Labo
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Matsuda Iwao
Department Of Physics School Of Science University Of Tokyo
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Oura Kenjiro
Department Of Elecronic Engineering Graduate School Of Engineering Osaka University
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Yamauchi Norihiro
Department Of Applied Chemistry Nagoya Institute Of Technology
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Hasegawa Shuji
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Ikuno Takashi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Wongwiriyapan Winadda
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Yamauchi Norihiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Matsuda Iwao
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Hobara Rei
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Katayama Mitsuhiro
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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