Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1985-06-20

著者

• Daimon Hiroshi

  Department Of Material Physics Faculty O Engineering Science Osaka University

• HASEGAWA Shuji

  Department of Physics, School of Science, University of Tokyo

• INO Shozo

  Department of Physics, Faculty of Science, University of Tokyo

• Ino Shozo

  Department Of Physics Faculty Of Science University Of Tokyo

• Hasegawa Shuji

  Department Of Physics Faculty Of Science University Of Tokyo:(present Adress) Advanced Research Labo

• YAMAMOTO Youiti

  Department of Physics, Faculty of Science, University of Tokyo

• Daimon Hiroshi

  Department Of Chemistry Faculty Of Science The University Of Tokyo

• Daimon Hiroshi

  Department Of Physics Faculty Of Science University Of Tokyo

• Yamamoto Youiti

  Department Of Physics Faculty Of Science University Of Tokyo:(present Address)jeol Ltd.

• HASEGAWA Shuji

  Department of Physics, Faculty of Science, University of Tokyo:(Present adress) Advanced Research Laboratory, Hitachi Ltd.

• DAIMON Hiroshi

  Department of Physics, Faculty of Science, University of Tokyo

• YAMAMOTO Youiti

  Department of Physics, Faculty of Science, University of Tokyo:(Present adress) Electron Optics Technical and Engineering Division, JEOL, Ltd.

関連論文

• Electrical Characterization of Metal-Coated Carbon Nanotube Tips
• Temperature-Dependent Change of Correlated Electronic States in Yb_4As_3 and Yb_4(As_Sb_x)_3 Probed by High Resolution Photoemission Spectroscopy
• Metal-coated Carbon Nanotube Tips for Nanoscale Electrical Measurements
• Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
• Surface-State Bands on Silicon : Si(111)-√×√-Ag Surface Superstructure
• Electronic Transport in Multiwalled Carbon Nanotubes Contacted with Patterned Electrodes
• Selective Growth of Straight Carbon Nanotubes by Low-Pressure Thermal Chemical Vapor Deposition
• Electronic Structure of Ni Intercalated TiS_2 Probed by Angle Resolved and 2p Core Resonance Photoemission as Well as by 2p Core Absorption Spectroscopy
• Photoemission and Absorption Spectroscopy of Mn_2Sb, MnAlGe, Mn_2As, Cr_2As and Fe_2As
• Resonance Photoemission Spectroscopy of Mn_2As, Cr_2As and Fe_2As
• Metastable Domain Structures of Ferromagnetic Microstructures Observed by Soft X-Ray Magnetic Circular Dichroism Microscopy
• Non-P-glycoprotein-mediated Atypical Multidrug Resistance in a Human Bladder Cancer Cell Line
• Angiomyofibroblastoma-like tumor (cellular angiofibroma) in the male inguinal region
• Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation
• New Models for the 7×7,5×5,2×8 Structures on Si(111) and Ge(111) Surfaces
• Symmetry Analysis of the Fermi Surface States of Sr_2RuO_4 by Display-Type Photoelectron Spectroscopy
• Characterization of Electronic States Using a Polarized Light and a Display Analyzer (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
• Photon-Stimulated Desorption Mechanism of Cl^+ Ions from Cl/Si(111) Surface
• Strong Circular Dichroism in Photoelectron Diffraction from Nonchiral, Nonmagnetic Material - Direct Observation of Rotational Motion of Electrons
• Growth of High-Mobility 3C-SiC Epilayers by Chemical Vapor Deposition : Semiconductors and Semiconductor Devices
• Photoluminescence of Unintentionally Doped and N-Doped 3C-SiC Grown by Chemical Vapor Deposition : Semiconductors and Semiconductor Devices
• Temperature Dependence of Electrical Properties of Nitrogen-Doped 3C-Sit
• High-Temperature Operation of Silicon Carbide MOSFET
• Annealing Effects on Al and AN-Si Contacts with 3C-SiC
• Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)
• Epitaxial Growth of Single-Crystal Ultrathin Films of Bismuth on Si(111)
• Theory of Transmission Coefficient of X-Rays Evanescent Wave for Grazing Incidence
• Change of Surface Electronic States Induced by Li and K Adsorption on the Si(111)7×7 Structure
• Observations of the Au/Si(111) System with a High-Resolution Ultrahigh-Vacuurn Scanning Electron Microscope
• Reflection High-Energy Electron Diffraction Study of the Growth of Ge on the Ge(111) Surface
• Si(111)-√21×√21-(Ag+Cs) Surface Studied by Scanning Tunneling Microscopy and Angle-Resolved Photoemission Spectroscopy
• Observation of In Growth Modes on Si(111)-√×√-Ga Using an Ultrahigh-Vacuum Scanning Electron Microscope
• Measurement of Differential Cross Sections of Low-Energy Electrons Elastically Scattered by Gas Molecules.III.Effect of Intramolecular Double Scattering as Observed in the Scattering of 70-400 eV Electrons by Carbon Tetrachloride
• Measurements of Differential Cross Sections of Low-Energy Electrons Elastically Scattered by Gas Molecules.II.Scattering of 200-500 eV Electrons by Molecular Oxygen
• Ion Oxidation of Si(111)
• Step Edges as Reservoirs of Ag Adatom Gas on a Si(111) Surface
• Surface Reconstruction on a Clean Si(110) Surface Observed by RHEED
• Formation of Si(111)-6×6 -Au Structure without Using a Vacuum Evaporation Technique Observed by Reflection High-Energy Electron Diffraction
• Substrate-Structure Dependence of Ag Electromigration on Au-Precovered Si(111) Surfaces
• Resonant Photoemission in Open and Closed 3d Shell Systems:Ni_xSi (x=3,2.5,2,1.5,1,and 0.5)
• Atomic Depth Distribution Analysis of In and Ga on Si(111) during Epitaxial Growth and New Surfactant-Mediated Epitaxy
• Selective Growth of Straight Carbon Nanotubes by Low-Pressure Thermal Chemical Vapor Deposition
• Dichroism in Core Photoelectron Diffraction Spectra of Si(001)and Dependence on the Photon Polarization
• Synthesis of Metal-Alloy-Coated Nanowires toward Functional Scanning Probe Microscope
• Electrical Characterization of Metal-Coated Carbon Nanotube Tips
• Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
• Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy)
• Electronic Transport in Multiwalled Carbon Nanotubes Contacted with Patterned Electrodes
• Si(111)-$\sqrt{21}\times\sqrt{21}$-(Ag+Cs) Surface Studied by Scanning Tunneling Microscopy and Angle-Resolved Photoemission Spectroscopy
• Fermi-Level Tuning of Topological Insulator Thin Films
• Fermi-Level Tuning of Topological Insulator Thin Films

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