Electrical Characterization of Metal-Coated Carbon Nanotube Tips
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概要
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Electrical characteristics of bare and metal-coated carbon nanotube (CNT) tips were investigated with an independently driven four-tip scanning tunneling microscope (STM). The CNT was glued on a W tip apex and wholly coated ex situ by metal thin layers. The resistance between the CNT-tip end and the W supporting tip scattered very widely from ca. 50 k$\Omega$ to infinity for the bare tips, while coating the tip with a 6-nm-thick PtIr film stably reduced the resistance to less than approximately 10 k$\Omega$. The W coating was also effective for stabilizing the resistance, although they showed slightly larger resistance (ca. 50 k$\Omega$). The metal-coated tips kept their low resistance and flexibility even after 100 repeated contacts to an object for conductivity measurements. They are expected to be useful for nanometer-scale transport measurements with multiprobe STM as well as for conventional single-tip STM.
- 2005-12-10
著者
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Honda Shin-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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YOSHIMOTO Shinya
Department of Physics, School of Science, University of Tokyo
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MURATA Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HOBARA Rei
Department of Physics, School of Science, University of Tokyo
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KISHIDA Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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KONISHI Hirofumi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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YASUDA Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Ikuno Takashi
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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Hasegawa Shuji
Department Of Physics Faculty Of Science University Of Tokyo:(present Adress) Advanced Research Labo
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Matsuda Iwao
Department Of Physics School Of Science University Of Tokyo
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Okado Hideaki
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Maeda Daisuke
Department Of Aeronautics And Astronautics Graduate School Of Engineering The University Of Tokyo
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Oura Kenjiro
Research Center for Ultra High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Kishida Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Okado Hideaki
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Katayama Mitsuhiro
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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