Surface Reconstruction on a Clean Si(110) Surface Observed by RHEED

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概要

• 論文の詳細を見る

• A "16-structure" was found from careful surface cleaning manners and RHEED observations to be only a superstructure appearing on a clean Si(110) surface. The present work also confirmed clearly that almost all surface structures reported previously were superstructures characteristic of Ni-contaminated Si(110) surfaces.

• 社団法人応用物理学会の論文
• 1986-04-20

著者

• INO Shozo

  Department of Physics, Faculty of Science, University of Tokyo

• Ino Shozo

  Department Of Physics Faculty Of Science University Of Tokyo

• YAMAMOTO Youiti

  Department of Physics, Faculty of Science, University of Tokyo

• ICHIKAWA Toshihiro

  The Research Institute for Iron, Steel and Other Metals, Tohoku University

• Ichikawa Toshihiro

  The Research Institute For Iron Steel And Other Metals

• Yamamoto Youiti

  Department Of Physics Faculty Of Science University Of Tokyo:(present Address)jeol Ltd.

関連論文

• Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation
• New Models for the 7×7,5×5,2×8 Structures on Si(111) and Ge(111) Surfaces
• Chemical Analysis of Surfaces by Total-Reflection-Angle X-Ray Spectroscopy in RHEED Experiments (RHEED-TRAXS)
• Theory of Transmission Coefficient of X-Rays Evanescent Wave for Grazing Incidence
• Change of Surface Electronic States Induced by Li and K Adsorption on the Si(111)7×7 Structure
• Observations of the Au/Si(111) System with a High-Resolution Ultrahigh-Vacuurn Scanning Electron Microscope
• Reflection High-Energy Electron Diffraction Study of the Growth of Ge on the Ge(111) Surface
• Observation of In Growth Modes on Si(111)-√×√-Ga Using an Ultrahigh-Vacuum Scanning Electron Microscope
• Recovery Processes of Si(111) and Ge(111) Surfaces Damaged by Argon Ion Bombardment
• Surface Reconstruction on a Clean Si(110) Surface Observed by RHEED
• Formation of Si(111)-6×6 -Au Structure without Using a Vacuum Evaporation Technique Observed by Reflection High-Energy Electron Diffraction
• CRYSTALLIZATION OF AMORPHOUS Si AND Ge PREPARED ON Si(111) AND Ge(111) SURFACES BY ARGON ION BOMBARDMENT
• Chemical Analysis of Surface by Fluorescent X-Ray Spectroscopy Using RHEED-SSD Method
• Atomic Depth Distribution Analysis of In and Ga on Si(111) during Epitaxial Growth and New Surfactant-Mediated Epitaxy
• Study of Metastable Structure of Pb-Sb Films Condensed at Low Temperature
• Electron Diffraction Study on the Structure of Amorphous Films Prepared by Low Temperature Condensation : I. Apparatus and Preliminary Results
• Electron Diffraction Study of Films of Body-Centered Cubic Metals Condensed at Low Temperature
• RHEED Study of Surface Reconstruction at Clean Ge(110) Surface
• Valence Band X-Ray Photoemission Spectrum of Amorphous Tellurium
• Electron Diffraction Study of Films of Body-Centered Cubic Metals Condensed at Low Temperature
• Study of Metastable Structure of Pb-Sb Films Condensed at Low Temperature
• Electron Diffraction Study on the Structure of Amorphous Tellurium Film Prepared by Low Temperature Condensation
• X-Ray Photoemission Spectrum of Amorphous Antimony Prepared by Low Temperature Condensation
• Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy)
• Ga-Induced Superstructures on Ge(111) Surfaces

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