Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1992-10-15

著者

• Daimon Hiroshi

  Graduate School Of Material Science Nara Advanced Institute Of Science And Technology

• Daimon Hiroshi

  Electrotechnical Laboratory

• Daimon Hiroshi

  Department Of Material Physics Faculty O Engineering Science Osaka University

• Hanada T

  Tokyo Univ. Agriculture Tokyo Jpn

• YAMANAKA Toshiro

  Department of Physics, Faculty of Science, University of Tokyo

• HANADA Takashi

  Research Laboratory of Engineering Materials, Tokyo Institute of Technology

• INO Shozo

  Department of Physics, Faculty of Science, University of Tokyo

• Ino Shozo

  Department Of Physics Faculty Of Science University Of Tokyo

• Daimon Hiroshi

  Department Of Chemistry Faculty Of Science The University Of Tokyo

• Yamanaka Toshiro

  Department Of Physics Faculty Of Science University Of Tokyo

• Yamanaka Toshiro

  Department Of Earth And Planetary Sciences Faculty Of Science Kyushu University

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