Daimon Hiroshi | Graduate School Of Material Science Nara Advanced Institute Of Science And Technology

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概要

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著作論文

Temperature-Dependent Change of Correlated Electronic States in Yb_4As_3 and Yb_4(As_Sb_x)_3 Probed by High Resolution Photoemission Spectroscopy
Development of Scanning Probe Microscope for Auger Analysis
Development of Electron Source for Auger Electron Spectroscopy in Scanning Probe Microscope Systems
Electronic Structure of Ni Intercalated TiS_2 Probed by Angle Resolved and 2p Core Resonance Photoemission as Well as by 2p Core Absorption Spectroscopy
Photoemission and Absorption Spectroscopy of Mn_2Sb, MnAlGe, Mn_2As, Cr_2As and Fe_2As
Resonance Photoemission Spectroscopy of Mn_2As, Cr_2As and Fe_2As
Metastable Domain Structures of Ferromagnetic Microstructures Observed by Soft X-Ray Magnetic Circular Dichroism Microscopy
Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation
New Models for the 7×7,5×5,2×8 Structures on Si(111) and Ge(111) Surfaces
Symmetry Analysis of the Fermi Surface States of Sr_2RuO_4 by Display-Type Photoelectron Spectroscopy
Characterization of Electronic States Using a Polarized Light and a Display Analyzer (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
Photon-Stimulated Desorption Mechanism of Cl^+ Ions from Cl/Si(111) Surface
Strong Circular Dichroism in Photoelectron Diffraction from Nonchiral, Nonmagnetic Material - Direct Observation of Rotational Motion of Electrons
Growth of High-Mobility 3C-SiC Epilayers by Chemical Vapor Deposition : Semiconductors and Semiconductor Devices
Photoluminescence of Unintentionally Doped and N-Doped 3C-SiC Grown by Chemical Vapor Deposition : Semiconductors and Semiconductor Devices
Temperature Dependence of Electrical Properties of Nitrogen-Doped 3C-Sit
High-Temperature Operation of Silicon Carbide MOSFET
Annealing Effects on Al and AN-Si Contacts with 3C-SiC
Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
Scanning Tunneling Microscopy Observation of Germapericycline on a Graphite Surface
Development of High-Energy-Resolution Display-Type Photoelectron Spectrometer in the Ultraviolet Photoelectron Spectroscopy Region
Self-Assembled Growth of Spinel (Fe,Zn)O-Perovskite BiFeO Nanocomposite Structures Using Pulsed Laser Deposition
Photoelectron Diffraction and Holographic Reconstruction of Graphite
Negative Photoelectron Diffraction Replica in Secondary Electron Angular Distribution
Development of Scanning Probe Microscope for Auger Analysis
Characterizing Edge and Stacking Structures of Exfoliated Graphene by Photoelectron Diffraction
Characterizing Edge and Stacking Structures of Exfoliated Graphene by Photoelectron Diffraction (SELECTED TOPICS IN APPLIED PHYSICS : Nano Electronics and Devices : Characterization and Control of Nano Surfaces and Interfaces)
Element Assignment for Three-Dimensional Atomic Imaging by Photoelectron Holography

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