Characterizing Edge and Stacking Structures of Exfoliated Graphene by Photoelectron Diffraction (SELECTED TOPICS IN APPLIED PHYSICS : Nano Electronics and Devices : Characterization and Control of Nano Surfaces and Interfaces)

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概要

• 論文の詳細を見る

著者

• Daimon Hiroshi

  Graduate School Of Material Science Nara Advanced Institute Of Science And Technology

• MATSUSHITA Tomohiro

  Japan Synchrotron Radiation Research Institute

• Matsui Fumihiko

  Graduate School Of Materials Science Nara Institute Of Science And Technology(naist)

• MATSUDA Hiroyuki

  Graduate School of Environment and Information Sciences, Yokohama National University

• Ishii Ryo

  Graduate School Of Culture And Information Science Doshisha University

• Koh Shinji

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

• Morita Makoto

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

• Kitagawa Satoshi

  Graduate School of Materials Science, Nara Institute of Science and Technology, Ikoma, Nara 630-0192, Japan

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