Electron Diffraction Study on the Structure of Amorphous Films Prepared by Low Temperature Condensation : I. Apparatus and Preliminary Results
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概要
- 論文の詳細を見る
An electron diffraction camera equipped with a sector has been constructed which enables one to observe diffracted intensities at sufficiently large scattering angles in order to improve the radial distribution analysis of electron diffraction patterns. Values of the structure-sensitive intensity I_m(s) have been obtained in the range from s=1.2 to 22.0 A^<-1> for an amorphous tellurium film condensed onto substrate at the liquid helium temperature by use of a sector of s^2-type. The radial distribution function of the film is also calculated from the obtained I_m(s).
- 東北大学の論文
著者
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Ichikawa Toshihiro
The Research Institute For Iron Steel And Other Metals
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OGAWA Shrio
The Research Institute for Iron, Steel and Other Metals
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Ogawa Shrio
The Research Institute For Iron Steel And Other Metals
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