Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-07-30
著者
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HONDA Shin-ichi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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IKUNO Takashi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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KATAYAMA Mitsuhiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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OURA Kenjiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Iwahashi Tomoya
Matsushita Electric Works Ltd.
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Takashi Ikuno
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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Oura K
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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OKADO Hideaki
Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University
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YOSHIMOTO Shinya
Department of Physics, School of Science, University of Tokyo
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MURATA Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HOBARA Rei
Department of Physics, School of Science, University of Tokyo
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MATSUDA Iwao
Department of Physics, School of Science, University of Tokyo
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KISHIDA Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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MAEDA Daisuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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YASUDA Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HASEGAWA Shuji
Department of Physics, School of Science, University of Tokyo
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Matsuda Iwao
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Maeda Daisuke
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Murata Yuya
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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HASEGAWA Shuji
Chiba City Institute of Health and Environment
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Yoshimoto S
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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