HOBARA Rei | Department of Physics, School of Science, University of Tokyo
スポンサーリンク
概要
関連著者
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HOBARA Rei
Department of Physics, School of Science, University of Tokyo
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YOSHIMOTO Shinya
Department of Physics, School of Science, University of Tokyo
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Honda Shin-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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YASUDA Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Hasegawa Shuji
Department Of Physics Faculty Of Science University Of Tokyo:(present Adress) Advanced Research Labo
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Katayama Mitsuhiro
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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Katayama Mitsuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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MURATA Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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KISHIDA Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HASEGAWA Shuji
Department of Physics, School of Science, University of Tokyo
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Ikuno Takashi
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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HASEGAWA Shuji
Chiba City Institute of Health and Environment
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Matsuda Iwao
Department Of Physics School Of Science University Of Tokyo
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HONDA Shin-ichi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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IKUNO Takashi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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KATAYAMA Mitsuhiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Takashi Ikuno
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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Oura K
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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KONISHI Hirofumi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Matsuda Iwao
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Wongwiriyapan Winadda
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Yoshimoto S
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Maeda Daisuke
Department Of Aeronautics And Astronautics Graduate School Of Engineering The University Of Tokyo
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OURA Kenjiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Iwahashi Tomoya
Matsushita Electric Works Ltd.
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OKADO Hideaki
Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University
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MATSUDA Iwao
Department of Physics, School of Science, University of Tokyo
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MAEDA Daisuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Maeda Daisuke
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Murata Yuya
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Okado Hideaki
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Oura Kenjiro
Department Of Elecronic Engineering Graduate School Of Engineering Osaka University
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Oura Kenjiro
Research Center for Ultra High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Kishida Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Honda Shin‐ichi
Osaka Univ. Osaka Jpn
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片山 光浩
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Katayama Mitsuhiro
Osaka Univ. Osaka Jpn
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OURA Kenjiro
Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University
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WONGWIRIYAPAN Winadda
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Yoshimoto Shinya
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Honda Shinichi
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Mori Y
Research Center For Ultra-precision Science And Technology Graduate School Of Engineering Osaka Univ
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Mori Y
Division Of Electric Electronic And Information Engineering Graduate School Of Engineering Osaka Uni
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Mori Yoshihiro
Ulsi Process Technology Development Center Semiconductor Company Matsushita Electronics Corp.
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YAMAUCHI Norihiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Mori Y
Osaka Univ. Suita Jpn
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Hasegawa Shuji
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Konishi Hirofumi
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Maruyama Y
Osaka City Univ. Osaka
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Kishida Masaru
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Yasuda Tatsuro
Osaka Univ. Grad. Sch. Of Eng. Dept. Of Electronic. Eng.
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Katayama M
Shin‐etsu Handotai Co. Ltd. Gunma Jpn
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Honda S
Nihon Univ. Koriyama Jpn
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Okado Hideaki
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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Honda Shin-ichi
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Honda Shini-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Katayama Mitsuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Yamauchi Norihiro
Department Of Applied Chemistry Nagoya Institute Of Technology
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Mori Y
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Katayama Mitsuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka University
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Hobara Rei
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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HONDA Shin-ichi
Osaka Univ., Grad. Sch. of Eng., Dept. of Electronic Eng.
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OURA Kenjiro
Osaka Univ., Res. Center for Ultrahigh Voltage Electron Microscopy
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Tomita Kazuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Hobara Rei
Univ. Of Tokyo Dept. Of Phys. Sch. Of Sci.
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Itoh Tadashi
Department Of Applied Physics Tohoku Unviersity
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MURATA Yuya
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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KISHIDA Masaru
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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KONISHI Hirohumi
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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MAEDA Daisuke
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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YASUDA Tatsuro
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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MOTOYOSHI Kenji
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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TOMITA Kazuhiro
Osaka Univ., Grad. Sch. of Eng. Dept. of Electronic. Eng.
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OKADO Hideaki
Osaka Univ., Research Center for Ultra-High Voltage Electron Microscopy
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YOSHIMOTO Sinya
Univ. of Tokyo, Dept. of Phys., Sch. of Sci.
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HASEGAWA Shuji
Univ. of Tokyo, Dept. of Phys., Sch. of Sci.
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Itoh T
Kyosera Co.ltd.
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Motoyoshi Kenji
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Tomita Kazuhiro
Department Of Engineering Science Nagoya Institute Of Technology
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Lee Jung-goo
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Mori Hirotaro
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Maeda Daisuke
Department Of Chemistry And Biochemistry Graduate School Of Engineering Kyushu University
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Tomita Kazuhiro
Osaka Univ. Grad. Sch. Of Eng. Dept. Of Electronic. Eng.
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Motoyoshi Kenji
Osaka Univ. Grad. Sch. Of Eng. Dept. Of Electronic. Eng.
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Hasegawa Shuji
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Hasegawa Shuji
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Ikuno Takashi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Maeda Daisuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Motoyoshi Kenji
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Tomita Kazuhiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Wongwiriyapan Winadda
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Konishi Hirofumi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Oura Kenjiro
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Murata Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Yamauchi Norihiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Matsuda Iwao
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Matsuda Iwao
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Okado Hideaki
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Hobara Rei
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Yasuda Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Lee Jung-Goo
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
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Honda Shin-ichi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
著作論文
- Electrical Characterization of Metal-Coated Carbon Nanotube Tips
- Metal-coated Carbon Nanotube Tips for Nanoscale Electrical Measurements
- Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
- Electronic Transport in Multiwalled Carbon Nanotubes Contacted with Patterned Electrodes
- Selective Growth of Straight Carbon Nanotubes by Low-Pressure Thermal Chemical Vapor Deposition
- Selective Growth of Straight Carbon Nanotubes by Low-Pressure Thermal Chemical Vapor Deposition
- Synthesis of Metal-Alloy-Coated Nanowires toward Functional Scanning Probe Microscope
- Electrical Characterization of Metal-Coated Carbon Nanotube Tips
- Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
- Electronic Transport in Multiwalled Carbon Nanotubes Contacted with Patterned Electrodes