Exploiting Metal Coating of Carbon Nanotubes for Scanning Tunneling Microscopy Probes
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概要
- 論文の詳細を見る
By exploiting the metal coating of carbon nanotube (CNT) tips for a scanning tunneling microscope (STM), we demonstrated atomic imaging/spectroscopy and showed their potential for electrical nanoprobes. A CNT glued to a W tip was uniformly coated with a thin W layer 3–6 nm thick. Using this tip, stable atomic imaging and spectroscopy were carried out on clean Si(111)-$7\times 7$ and Si(100)-$2\times 1$ surfaces. The mechanical flexibility of the coated CNT was maintained by virtue of the thin-layer coating, enabling repeated direct contact to the sample surface. Two W-coated CNT tips were brought together within a distance of approximately 50 nm. These results indicate that the tips are useful for electronic transport measurements on a nanometer scale after installation into a multiprobe STM.
- 2005-07-15
著者
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Honda Shin-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Katayama Mitsuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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YOSHIMOTO Shinya
Department of Physics, School of Science, University of Tokyo
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MURATA Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HOBARA Rei
Department of Physics, School of Science, University of Tokyo
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KISHIDA Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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YASUDA Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Ikuno Takashi
Department Of Electric Engineering Graduate School Of Engineering Osaka University
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Hasegawa Shuji
Department Of Physics Faculty Of Science University Of Tokyo:(present Adress) Advanced Research Labo
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Matsuda Iwao
Department Of Physics School Of Science University Of Tokyo
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Okado Hideaki
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Oura Kenjiro
Department Of Elecronic Engineering Graduate School Of Engineering Osaka University
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Maeda Daisuke
Department Of Aeronautics And Astronautics Graduate School Of Engineering The University Of Tokyo
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Hasegawa Shuji
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Maeda Daisuke
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Murata Yuya
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Kishida Masaru
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Matsuda Iwao
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Hobara Rei
Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
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Katayama Mitsuhiro
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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Yasuda Tatsuro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Honda Shin-ichi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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