Direct Growth of Single-Walled Carbon Nanotube Networks on Alumina Substrate: A Novel Route to Ultrasensitive Gas Sensor Fabrication

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概要

• 論文の詳細を見る

• We explored structural and electrical properties of single-walled carbon nanotube (SWNT) networks directly grown on alumina substrates. The netlike SWNTs were uniformly grown on the substrate at a high quality. From the Raman spectroscopy analysis it was found that the as-grown SWNT networks were a mixture of metallic and semiconducting SWNTs, while the SWNT networks after their electrical breakdown exhibited a predominance of the semiconducting property. The direct growth method and subsequent electrical breakdown facilitated high-throughput production of practical ultrasensitive sensors for pollutant gases with a high sensitivity, which was demonstrated by NO2 detection.

• 2005-11-15

著者

• Honda Shin-ichi

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• Katayama Mitsuhiro

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• KONISHI Hirofumi

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• MIZUTA Tomoaki

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• OHMORI Takafumi

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University

• MURAKAMI Toshiya

  Department of Electronics and Information Science, Kyoto Institute of Technology

• Wongwiriyapan Winadda

  Department Of Electronic Engineering Graduate School Of Engineering Osaka University

• Ito Tatsuya

  New Cosmos Electric Co. Ltd.

• Suzuki Kengo

  New Cosmos Electric Co. Ltd.

• Maekawa Toru

  New Cosmos Electric Co. Ltd.

• Kisoda Kenji

  Faculty Of Education Wakayama University

• Harima Hiroshi

  Department Of Applied Physics Osaha University

• Ishikawa Hiroshi

  New Cosmos Electric Co. Ltd.

• Mizuta Tomoaki

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

• Oura Kenjiro

  Research Center for Ultra High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

• Suzuki Kengo

  New Cosmos Electric Co., Ltd., 3-6-25 Mitsuya-naka, Yodogawa-ku, Osaka 532-0036, Japan

• Wongwiriyapan Winadda

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

• Konishi Hirofumi

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

• Harima Hiroshi

  Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo, Kyoto 606-8585, Japan

• Ohmori Takafumi

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

• Maekawa Toru

  New Cosmos Electric Co., Ltd., 3-6-25 Mitsuya-naka, Yodogawa-ku, Osaka 532-0036, Japan

• Katayama Mitsuhiro

  Department of Elecronic Engineering, Graduate School of Engineering, Osaka University

• Katayama Mitsuhiro

  Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

• Murakami Toshiya

  Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo, Kyoto 606-8585, Japan

• Murakami Toshiya

  Department of Electronics and Information Science, Kyoto Institue of Technology, Matsugasaki, Sakyo, Kyoto 606-8585, Japan

• Ishikawa Hiroshi

  New Cosmos Electric Co., Ltd., 3-6-25 Mitsuya-naka, Yodogawa-ku, Osaka 532-0036, Japan

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