Ion Channeling Study of SrTiO_3 Substrates and As-Deposited YBa_2Cu_3O_x Thin Films
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概要
- 論文の詳細を見る
The crystalline quality (perfection or imperfection) of SrTiO_3 substrates and subsequent as-deposited YBa_2Cu_3O_x superconducting films has been investigated by a high-energy ion channeling technique. Analysis was performed as a function of depth, especially at 3 typical depth regions (surface, inside, interface), to clarify junction ordering features between substrates and films. Based on ion channeling measurements, it has been found that (1) disorders of substrates affect crystalline quality of films greatly at the interface regions, (2) the film reorders over a proper amount of YBa_2Cu_3O_x disordered layers (as in buffer layers), (3) the film consists of an almost single domain. The crystalline quality of some SrTiO_3 substrates widely used in Japan has also been investigated and the common characteristics of distortions along the c-axis have been found.
- 社団法人応用物理学会の論文
- 1993-01-15
著者
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Oura K
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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Terashima Takahito
Institute for Chemical Research, Kyoto University
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WATAMORI Michio
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Bando Yoshichika
Institute For Chemical Reaearch Kyoto University
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Shoji F
Electron Engineering Faculty Of Engineering Osaka University
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Shoji Fumiya
Electron Beam Laboratory Faculty Of Engineering Osaka University
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Oura Kenjiro
Electron Beam Laboratory Faculty Of Engineering Osaka University
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Watamori Michio
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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WATAMORI Michio
Low Temperature Center, Osaka University
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Terashima Takahito
Institute For Chemical Research Kyoto University
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Terashima Takahito
Institute For Chemical Reaearch Kyoto University
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