Scanning Tunneling Microscope Observation of Si(111)-3×1-Ag Structure
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概要
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A scanning tunneling microscope has been used to study the Si(111)-3×1-Ag surface. The 3×1-Ag surface has been observed to consist of a bright row and small protrusions; the bright row points in the <1^^-10> direction and the protrusions point in the <123^^-> and <213^^-> directions. The width of 3×1-Ag domains, nucleated on the Si-7×7 terraces, has been found to be (21n-2)a, where n is an integer (n=1, 2, …) and a is the lattice constant of Si (a=3.84 Å). Detailed investigation on domain boundaries reveals that both sides of the 3×1-Ag domain face the unfaulted halves of the 7×7 structure. Moreover, two types of domain boundaries have been observed: one which runs across the corner holes, and another is that runs apart from the corner holes, leaving a narrow 7×7 terrace of one adatom width. Possible structural models for the 3×1-Ag surface are proposed based on the present STM results.
- 社団法人応用物理学会の論文
- 1994-06-30
著者
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OURA Kenjiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Oura K
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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Ohnishi Hiroaki
Fujitsu Laboratories Ltd.
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Ohnishi H
Taihei Kogyo Co. Ltd. Himeji Jpn
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Ohnishi Hiroaki
Division Of Hematology Faculty Of Medicine Kagawa University
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Ohnishi Hideaki
Department Of Materials Science Faculty Of Engineering Toin University Of Yokohama
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KATAYAMA Itsuo
Department of Applied Physics, Faculty of General Education, Osaka Institute of Technology
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OHBA Yasuyuki
Department of Applied Physics, Faculty of General Education, Osaka Institute of Technology
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Oura Kenjiro
Department Of Elecronic Engineering Graduate School Of Engineering Osaka University
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Ohba Yasuyuki
Department Of Inorganic Materials Faculty Of Engineering Tokyo Institute Of Technology
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Katayama I
Department Of Applied Physics Faculty Of General Education Osaka Institute Of Technology
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