Ryu Jeong-tak | Faculty Of Computer & Communication Engineering Taegu University
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概要
関連著者
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OURA Kenjiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Oura K
Research Center For Ultrahigh Voltage Electron Microscopy Osaka University
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Katayama Mitsuhiro
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Ryu Jeong-tak
Faculty Of Computer & Communication Engineering Taegu University
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Oura Kenjiro
Department Of Elecronic Engineering Graduate School Of Engineering Osaka University
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Katayama Mitsuhiro
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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KATAYAMA Mitsuhiro
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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RYU Jeong-Tak
Department of Computer and Communication Engineering Taegu University
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Ryu Jeong-tak
Department Of Computer And Communication Engineering Daegu University
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FUJINO Toshiaki
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Fuse T
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Fujino Takahiro
Research Institute For Advanced Science And Technology Osaka Prefecture University
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Fujino Toshiaki
Department of Elecronic Engineering, Graduate School of Engineering, Osaka University
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Hirao Takashi
Department Of Electrical Engineering Osaka University
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Hiramatsu Takahiro
Res. Inst. For Nanodevices Kochi Univ. Of Technol. 185 Miyanokuchi Tosayamada-cho Kami Kochi 782-850
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Hirao T
Central Research Laboratories Matsushita Electric Industrial Co. Ltd.
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Kubo Osamu
Department Of Neurosurgery Institute Of Clinical Neurology Tokyo Women's Medical University
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Hirao T
Research Institute For Nano-devices Kochi University Of Technology
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FUSE Takashi
Department of Electrical and Electronic Engineering, Faculty of Engineering, Tokyo Institute of Tech
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Kubo O
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Kubo Osamu
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Fuse Takashi
Department Of Electrical And Electronic Engineering Faculty Of Engineering Tokyo Institute Of Techno
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Kohmoto O
Okayama Univ. Okayama Jpn
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Kubo Osamu
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Hirao Takashi
Central Research Laboratories Matsushita Electric Industrial Co. Ltd.
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Katayama Mitsuhiro
Osaka Univ. Osaka Jpn
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HARADA Toru
Department of Pediatric Surgery, Nagoya University Graduate School of Medicine
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YAMAZAKI Yujin
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Inodzuka Katsuhiko
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Harada Toru
Department Of Pathology Jikei University School Of Medicine
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Yamazaki Y
Fuji Xerox Co. Ltd. Kanagawa Jpn
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Katayama M
Shin‐etsu Handotai Co. Ltd. Gunma Jpn
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YAMAZAKI Yoshishige
National Laboratory for High Energy Physics
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KOBAYASHI Tadashi
Department of Physics, Aoyama Gakuin University
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Saranin A
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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SARANIN Alexander
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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ZOTOV Andrey
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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RYU Jeong
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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TANI Hitoshi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Zotov A
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Zotov Andrey
大阪大学大学院工学研究科電子工学専攻
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INUDZUKA Katsuhiko
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Saranin Alexander
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Alexander A.
大阪大学大学院工学研究科電子工学専攻
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Kobayashi Tadashi
Department Of Cardiology Aichi Medical University
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Tani H
Tohoku Univ. Sendai Jpn
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Kobayashi T
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Wang Xiao
Department of Medical Microbiology, Shandong University School of Medicine
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LEE Kuei-Yi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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HIRAO Takashi
Department of Electrical Engineering, Graduate School of Engineering, Osaka University
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Lee Kuei-yi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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ARIMATSU Daiki
Department of Electronic Engineering, Faculty of Engineering Osaka University
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KOHARA Hidekazu
Department of Electronic Engineering, Faculty of Engineering Osaka University
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Arimatsu Daiki
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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YAMAOKA Nobumitsu
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Kohara Hidekazu
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Lee K‐y
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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KATAYAMA Mitsuhito
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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INOUE Shin-ichi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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INODZUKA Katsuhiko
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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KUI Koichiro
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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NODA Kenji
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Lee Ki-young
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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Harada T
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Kui Koichiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Noda Kenji
Department Of Applied Science For Electronics And Materials Graduate School Of Engineering Sciences
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Wang Xiao
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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Hirao Takashi
Department Of Electrical Engineering Graduate School Of Engineering Osaka University
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Katayama Mitsuhiro
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Inoue Shin-ichi
Department Of Electronic Engineering Graduate School Of Engineering Osaka University
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Hirao Takashi
Department Of Chemistry Faculty Of Science And Technology Keio University
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Wang Xiao
Department Of Applied Physics And Materials Research Center The Hong Kong Polytechnic University
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Yamaoka Nobumitsu
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Inoue Shin-ichi
Department Of Applied Chemistry Aichi Institute Of Technology
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Wang Xiao
Department Of Aeronautical Engineering Nagoya University
著作論文
- Development of New Apparatus for Field Emission Measurement
- Mg/Si(100) Reconstructions Studied by Scanning Tunneling Microscopy
- Atomic Hydrogen Interaction with the Si(100)4×3-In Surface Studied by Scanning Tunneling Microseopy
- Coaxial Impact-Collision Ion Scattering Spectroscopy and Time-of-Flight Elastic Recoil Detection Analysis for In Situ Monitoring of Surface Processes in Gas Phase Atmosphere : Surfaces, Interfaces, and Films
- Structural Analysis of 6H-SiC(0001)√ × √ Reconstructed Surface
- Silver-Induced 3 × 3 Phase on 6H-SiC(0001)√ × √ Surface
- Adsorption of Atomic Hydrogen on Ag-Covered 6H-SiC(0001) Surface
- Direct Observation of Strained Layer Formation at the Initial Stage of In Thin Film Growth on Si(100)
- Total Cross Section of Electron Stimulated Desorption of Hydrogen from Hydrogen-Terminated Ge/Si(001) as Observed by Time of Flight Elastic Recoil Detection Analysis
- Adsorption of H on the Ge/Si(001) Surface as Studied by Time-of-Flight Elastic Recoil Detection Analysis and Coaxial Impact Collision Ion Scattering Spectroscopy
- Adsorption of Atomic Eydrogen on the Si(100)-(2×1)-Sb Surface