Deep Electron Traps in n-InP Induced by Plasma Exposure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-10-15
著者
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Sugino T
Osaka Univ. Osaka Jpn
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NINOMIYA Hideaki
Department of Neuropsychiatry, Graduate School of Medical Sciences, Kyushu University
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SHIRAFUJI Junji
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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Matsuda Kazuko
Faculty Of Engineering Kanazawa University
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Matsuda K
Univ. Cambridge Cambridge Gbr
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Matsuda K
Waseda Univ. Tokyo Jpn
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MATSUDA Koichiro
Horiba, Ltd.
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SUGINO Takashi
Department of Electrical Engineering, Osaka University
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SAKAMOTO Yoshifumi
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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Ninomiya Hideaki
Department Of Neuropsychiatry Faculty Of Medicine Kyushu University
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Sakamoto Y
Department Of Applied Chemistry Tokyo Metropolitan University
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Sugino T
Department Of Electrical Engineering. Osaha University
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Ninomiya H
Kyushu Univ. Fukuoka Jpn
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Shirafuji J
Fukui Univ. Technol.
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Shirafuji Junji
Department Of Electrical And Electronic Engineering
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Sugino Takashi
Department Of Basic Pathology Fukushima Medical University
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NINOMIYA Hideaki
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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