Sugino T | Department Of Electrical Engineering. Osaha University
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概要
関連著者
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Sugino T
Osaka Univ. Osaka Jpn
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SUGINO Takashi
Department of Electrical Engineering, Osaka University
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Sugino T
Department Of Electrical Engineering. Osaha University
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Sugino Takashi
Department Of Basic Pathology Fukushima Medical University
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SHIRAFUJI Junji
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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Shirafuji J
Fukui Univ. Technol.
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Shirafuji Junji
Department Of Electrical And Electronic Engineering
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Matsuda Kazuko
Faculty Of Engineering Kanazawa University
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Matsuda K
Univ. Cambridge Cambridge Gbr
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Matsuda K
Waseda Univ. Tokyo Jpn
著作論文
- Characterization of GaAs Surfaces Treated with Remote PH_3 Plasma
- Characterization of InGaAs Phosphidized by a Plasma Process
- Behavior of Electron Traps in Phosphidized GaAs by Nitrogen Plasma Treatment
- Deep Electron Traps in n-InP Induced by Plasma Exposure
- Effect of Hydrogen Plasma Treatment on n-InP Surfaces
- Characteristics of Electron Trap Induced in n-InP by Hydrogen Plasma Exposure
- Effect of Phosphine on Plasma-Induced Traps in n-InP
- Measurement of Surface Fermi Level in Phosphidized GaAs
- Evidence for Phosphorus Passivation of Plasma-Induced Damage at GaAs Surface Probed by EL2 Traps
- Effect of Surface Phosphidization on GaAs Schottky Barrier Junctions