Annealing Behavior of Defects in Electron-Irradiated p-Type CdTe
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1974-06-05
著者
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TAGUCHI Tsunemasa
Department of Electrical and Electronic Engineering, Yamaguchi University
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INUISHI Yoshio
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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SHIRAFUJI Junji
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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Inuishi Yoshio
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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Taguchi Tsunemasa
Department Of Electrical And Electronic Engineering Faculty Of Engineering Yamaguchi University
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Shirafuji Junji
Department Of Electrical Engineering Faculty Of Engineering Osaka University
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Shirafuji Junji
Department Of Electrical And Electronic Engineering
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