An Evidence for Ballistic Transport in Nanocrystalline Porous Silicon Layer by Time-of-Flight Measurements
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Koshida Nobuyoshi
Department Of Electrical And Electronic Engineering Faculty Of Technology Tokyo University Of Agricu
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Kojima Akira
Department Of Chemical And Materials Science Gunma National College Of Technology
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Kojima Akira
Department Of Electrical And Electronic Engineering Faculty Of Technology Tokyo University Of Agricu
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Koshida Nobuyoshi
Department Of Electrical And Electronic Engineering Faculty Of Technology Graduate School Of Eng. To
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Koshida Nobuyoshi
Department Of Electrical And Electronic Engineering Faculty Of Technology Tokyo University Of Agricu
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