Effects of Thermal Effusivity in Nanocrystalline Porous Silicon on Long-Term Operation of Thermally Induced Ultrasonic Emission
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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KOSHIDA Nobuyoshi
Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agri
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Koshida Nobuyoshi
Department Of Electrical And Electronic Engineering Faculty Of Technology Tokyo University Of Agricu
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WATABE Yoshifumi
New Product Technologies Development Department, Matsushita Electric Works, Ltd.
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HONDA Yoshiaki
New Product Technologies Development Department, Matsushita Electric Works, Ltd.
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Honda Yoshiaki
New Product Technologies Development Department Matsushita Electric Works Ltd.
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Watabe Yoshifumi
New Product Technologies Development Department Matsushita Electric Works Ltd.
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Koshida Nobuyoshi
Department Of Electrical And Electronic Engineering Faculty Of Technology Graduate School Of Eng. To
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