Impact of Image and Exchange-Correlation Effects on Ballistic Electron Transport in Nanoscale Double-Gate Metal-Oxide-Semiconductor Transistors
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概要
- 論文の詳細を見る
- Japan Society of Applied Physicsの論文
- 2004-09-15
著者
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MATSUDA Toshihiro
Department of Information Systems Engineering, Toyama Prefectural University
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IWATA Hideyuki
Department of Information Systems Engineering, Toyama Prefectural University
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Matsuda T
Department Of Information Systems Engineering Toyama Prefectural University
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OHZONE Takashi
Department of Communication Engineering, Okayama Prefectural University
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Matsuda Toshihiro
Department Of Information Systems Engineering Toyama Prefectural University
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Matsuda T
Department Of Electronics And Informatics Toyama Prefectural University
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Ohzone T
Dawn Enterprise Co. Ltd.
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Ohzone Takashi
Department Of Communication Engineering Okayama Prefectural University
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Iwata Hideyuki
Department Of Electronics And Informatics Toyama Prefectural University
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Matsuda Toshihiro
Department of Electronics and Informatics, Toyama Prefectural University
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