Quantum-Mechanical Simulation of Counter Doped Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Single Work Function Metal Gate

スポンサーリンク

概要

著者

関連論文

Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide
Symptomatic Chiari Malformation and Associated Pathophysiology in Pediatric and Adult Patients without Myelodysplasia
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
A CMOS Temperature Sensor Circuit(Integrated Electronics)
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width(Semiconductor Materials and Devices)
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET(Semiconductor Materials and Devices)
An Accurate and Computationally Efficient Method for Device Simulation with Scattering in Nanoscale Double-Gate Metal-Oxide-Semiconductor Transistors
Electroluminescence from MOS Capacitors with Si Implanted Oxide on p-type and n-type Si Substrate
A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit(Integrated Electronics)
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission(Microelectronic Test Structures)
Impact of Image and Exchange-Correlation Effects on Ballistic Electron Transport in Nanoscale Double-Gate Metal-Oxide-Semiconductor Transistors
Quantum-Mechanical Simulation of Counter Doped Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Single Work Function Metal Gate
Visible Electroluminescence from MOS Capacitors with Si-Implanted SiO_2(Special Issue on Electronic Displays)
Quantum-Mechanical Simulation of Gate Tunneling Current in Accumulated n-Channel Metal-Oxide-Semiconductor Devices with n^+-Polysilicon Gates
A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs(Special Issue on Microelectronic Test Structures)
A Study on Hot-Carrier-Induced Photoemission in n-MOSFETs (Special Issue on Microelectronic Test Structures)
EXAGGERATED CENTRAL CARDIOVASCULAR RESPONSES TO ANGIOTENSIN II AND RENIN AND INHIBITION BY ORAL TAURINE IN SPONTANEOUSLY HYPERTENSIVE RATS
Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
Temperature Dependence of Single Event Charge Collection in SOI MOSFETs by Simulation Approach (Special Issue on SOI Devices and Their Process Technologies)
Self-Consistent Calculations of Performance Parameters in Highly Doped Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors : Semiconductors
Fully Quantum-Mechanical Calculation of Gate Tunneling Current in Ultrathin Silicon-on-Insulator Metal-Oxide-Semiconductor Devices : Semiconductors
Photocarrier Generation Rate Model of Textured Silicon Solar Cells
Transport Equations for Homogeneous and Variable-Composition Semiconductor Devices at Low Temperature
Impact of Surface Band Bending at the Rear Si-SiO_2 Interface on Conversion Efficiency of Rear Locally-Contacted Silicon Solar Cells
Reduction of A Surge-Pulse by A New CMOS-type Diode
The Influence of Megnetic Plugging on RF Plasma Density
A Two-Dimensional Analysis of Hot-Carrier Photoemission from LOCOS and Trench-Isolated MOSFETs
Fully Quantum-Mechanical Calculation of Hole Direct Tunneling Current in Ultrathin Gate Oxide p-Channel Metal-Oxide-Semiconductor Devices
TCP Congestion Control with ACK-Pacing for Vertical Handover(Network)
Network Supported Bandwidth Control for TCP in Hierarchical Mobile Internet(Internet)
Mismatch of Packet Recovery Mechanisms for Bit Error and Handover in Wireless TCP(TCP)(Networking Technologies for Mobile Internet Systems)
Numerical Simulation of Silicon-on-Insulator Thin-Film Solar Cells
C-V and I-V Characteristics of a MOSFET with Si-Implanted Gate-SiO_2
Wiener-Hopf Analysis of the Diffraction by an Impedance Wedge : The Case of E Polarization
Electrical Characteristics of n- and p-MOSFETs with Gates Crossing Source/Drain Regions at 90゜and 45゜ (Special Issue on Microelectronic Test Structure)
Two-Dimensional Self-Consistent Calculation of Gate Direct Tunneling Current in Metal-Oxide-Semiconductor Transistors
Green Electroluminescence from Metal–Oxide–Semiconductor Devices Fabricated by Spin Coating of Terbium Organic Compounds on Silicon
Green/Red Electroluminescence from Metal--Oxide--Semiconductor Devices Fabricated by Spin-Coating of Rare-Earth Organic Compounds on Silicon
An Accurate and Computationally Efficient Method for Device Simulation with Scattering in Nanoscale Double-Gate Metal–Oxide–Semiconductor Transistors
Two-Dimensional Self-Consistent Calculation of Gate Direct Tunneling Current in Metal–Oxide–Semiconductor Transistors
Impact of Surface Band Bending at the Rear Si–SiO2 Interface on Conversion Efficiency of Rear Locally-Contacted Silicon Solar Cells

もっと見る

スポンサーリンク