Matsuda Toshihiro | Department Of Information Systems Engineering Toyama Prefectural University

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概要

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著作論文

Symptomatic Chiari Malformation and Associated Pathophysiology in Pediatric and Adult Patients without Myelodysplasia
A CMOS Temperature Sensor Circuit(Integrated Electronics)
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width(Semiconductor Materials and Devices)
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET(Semiconductor Materials and Devices)
An Accurate and Computationally Efficient Method for Device Simulation with Scattering in Nanoscale Double-Gate Metal-Oxide-Semiconductor Transistors
Electroluminescence from MOS Capacitors with Si Implanted Oxide on p-type and n-type Si Substrate
A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit(Integrated Electronics)
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission(Microelectronic Test Structures)
Impact of Image and Exchange-Correlation Effects on Ballistic Electron Transport in Nanoscale Double-Gate Metal-Oxide-Semiconductor Transistors
Quantum-Mechanical Simulation of Counter Doped Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Single Work Function Metal Gate
Visible Electroluminescence from MOS Capacitors with Si-Implanted SiO_2(Special Issue on Electronic Displays)
Quantum-Mechanical Simulation of Gate Tunneling Current in Accumulated n-Channel Metal-Oxide-Semiconductor Devices with n^+-Polysilicon Gates
A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs(Special Issue on Microelectronic Test Structures)
A Study on Hot-Carrier-Induced Photoemission in n-MOSFETs (Special Issue on Microelectronic Test Structures)
EXAGGERATED CENTRAL CARDIOVASCULAR RESPONSES TO ANGIOTENSIN II AND RENIN AND INHIBITION BY ORAL TAURINE IN SPONTANEOUSLY HYPERTENSIVE RATS
Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
TCP Congestion Control with ACK-Pacing for Vertical Handover(Network)
Network Supported Bandwidth Control for TCP in Hierarchical Mobile Internet(Internet)
Mismatch of Packet Recovery Mechanisms for Bit Error and Handover in Wireless TCP(TCP)(Networking Technologies for Mobile Internet Systems)
Wiener-Hopf Analysis of the Diffraction by an Impedance Wedge : The Case of E Polarization

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