Lee Young-jong | Lg Semicon. Ltd.
スポンサーリンク
概要
関連著者
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Lee Y‐j
Samsung Electronics Co. Ltd. Kyunggi‐do Kor
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Lee Young-jong
Lg Semicon. Ltd.
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Lee Young-jong
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Young-jong
Advanced Technology Laboratory. Lg Semicon Co.
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LEE Young-Jong
Advanced Technology Laboratory., LG Semicon Co.
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LEE Young-Jong
LG Semicon.,Ltd.
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Lee S‐g
Korea Univ. Chungnam Kor
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Jung J‐w
Hanyang Univ. Seoul Kor
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Son Jeong-hwan
Hyundai Electronics Industries Co. Ltd.
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Jung Jong-wan
Hyundai Electronics Industries Co. Ltd.
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Son J‐h
Hyundai Electronics Industries Co. Ltd.
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Kwon Oh-kyong
Department Of Electrical Engineering Hanyang University
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LEE Hi-Deok
Advanced Technology Laboratory., LG Semicon Co.
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JEONG Ju-Young
Department of Electrical Engineering The University of Suwon
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LEE Chang-Hyo
Department of Physics Hanyang University
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Hwang Jeong-Mo
Advanced Technology Laboratory., LG Semicon Co.,
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Kwon O‐k
Division Of Electrical And Computer Engineering Hanyang University
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Kwon Oh-keun
Semiconductor Process And Device Laboratory Dept. Of Electronic Engineering Chung-ang University
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Lee Hi-deok
R&d Division Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory. Lg Semicon Co.
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Lee Kyung-ho
Lg Semicon Co. Ltd.
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Hwang J‐m
Hyundai Microelectronics Co. Cheongju Kor
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Hwang Jeong-mo
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Hwang Jeong-mo
R&d Division Lg Semicon Co. Ltd.
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Hwang Jeong-mo
R&d Division Hyundai Microelectronics Co.
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JUNG Jong-Wan
LG Semicon Co., Ltd.
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SON Jeong-Hwan
LG Semicon Co., Ltd.
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Hwang Jeong-mo
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Hwang J.-m.
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Lee H‐d
Chungnam National Univ. Taejon Kor
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Lee sang-Gi
Dept. of Physics Hanyang Univ.
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Jeong Ju-Young
Dept. of Elec. Eng., The Univ. of Suwon.
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Kwon Oh-Kyong
Dept. of Elec. Eng., Hanyang Univ.
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Lee Chang-Hyo
Dept. of Physics Hanyang Univ.
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Yang W
Lg Semicon Co. Ltd. Cheongju‐si Kor
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Cho W‐j
Lg Semicon Co. Ltd.
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Cho Won-ju
Lg Semicon Co. Ltd.
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Kim Young
College of Pharmacy, Chungnam National University
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Kim Young
Korea Food Research Institute
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EO Yungseon
Department of Electrical Engineering Hanyang University
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Hwang Hyunsang
Advanced Technology Laboratory., LG Semicon Co.,
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Kwon Young-in
Dep. Of Food And Nutrition Hannam Univ.
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Cho Nam
Lg Semicon. Ltd.
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HWANG Hyunsang
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology
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Kim J‐m
Department Of Manufacturing Science Graduate School Of Engineering Osaka University
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KIM Jong-Kwan
LG Semicon.,Ltd.
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Park Seong-Hyung
LG Semicon.,Ltd.
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Huh Yun
LG Semicon.,Ltd.
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Kim In
Korea University
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Yang Wouns
LG Semicon.,Ltd.
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Hwang Jung
LG Semicon.,Ltd.
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SUNG Yung-Kwon
Korea University
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Kim Young
Coll. Of Pharmacy Chungnam National Univ.
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LEE Kye-Nam
Advan. Tech. Lab., LG Semicon Co., Ltd.
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Hwang Jung
Lg Semicon. Ltd.
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Kim Jong-min
Materials & Devices Lab. Samsung Advanced Institute Of Technology
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Kim Jong-min
Hyundai Electronics Industries Co. Ltd.
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Kim Jong-kwan
Lg Semicon. Ltd.
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Kim Jong-kwan
Department Of Agricultural Biology Korea University
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Kim Young
Korea And College Of Pharmacy Chungbuk National University
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Hwang H
Gwangju Inst. Sci. And Technol. Gwangju Kor
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Hwang H
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
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Hwang Hyunsang
Advanced Technology Laboratory. Lg Semicon Co.
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Huh Yun
Lg Semicon. Ltd.
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Kim Y
College Of Pharmacy Chungnam National University
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LEE Seung-Ho
Advanced Technology Laboratory, LG Semicon Co., Ltd.
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Park Seong-hyung
Lg Semicon. Ltd.
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Hwang Hyunsang
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
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Kim Young
Korea University
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Kim In
Korea Electronics Technology Institute Electronics Devices Research Center
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Kim I
Kwangju Inst. Sci. And Technol. (k‐jist) Gwangju Kor
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Lee Kye-nam
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Yang Wouns
Lg Semicon. Ltd.
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Kim In
Korea Advanced Institute Of Science And Technology
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LEE Sang-Gi
Department of Physics Hanyang University
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Hwang Hyun-sang
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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JUNG Jong-Wan
Advan. Tech. Lab., LG Semicon Co., Ltd.
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Yang Wouns
Advanced Technology Laboratory Lg Semicon Co.
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Yang Wouns
Advanced Technology Development Team
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Yang Wouns
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Donghoon
Advansed Technology Laboratory. Lg Semicon Co.
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Son Jeong-hwan
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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LEE Youngjong
Hyundai Electronics Industries Co., Ltd.
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KIM Jong-Min
LG Semicon Co., Ltd.
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CHUNG Shin-Young
LG Semicon Co., Ltd.
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KIM Hyun-Cheol
LG Semicon Co., Ltd.
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Lee Youngjong
Hyundai Electronics Industries Co. Ltd.
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LEE Sang-Gi
Advanced Technology Laboratory, LG Semicon Co., Ltd.
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EO Yungseon
Dept. of Elec. Eng., Hanyang Univ.
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Lee Kye-nam
Advansed Technology Laboratory. Lg Semicon Co.
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Kwon Oh-kyong
Department Of Electoronic Engineering Hanyang University
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Jung Jong-wan
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Kim Hyun-cheol
Lg Semicon Co. Ltd.
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Chung Shin-young
Lg Semicon Co. Ltd.
著作論文
- Trade-Off between Hot Carrier Effect and Current Driving Capability Due to Drain Contact Structures in Deep Submicron MOSFETs
- Effects of Low Temperature Interlayer Dielectric Films on the Gate Oxide Quality of Deep Submicron MOSFET's
- Effects of Low Temperature Interlayer Dielectric Films on the Gate Oxide Quality of Deep Submicron MOSFET's
- Defects study of retrograde twin well CMOS that has MeV ion implanted buried layer
- Defects study of retrograde twin well CMOS that has MeV ion implanted buried layer
- Characterization of Corner Induced Leakage Current in Shallow Silicided n^+/p Junction
- Shallow Trench Isolation Characteristics with High-Density-Plasma Chemical Vapor Deposition Gap-Fill Oxide for Deep-Submicron CMOS Technologies
- Dependence of Subthreshold Hump and Reverse Narrow Channel Effect on the Gate Length by Suppression of Transient Enhanced Diffusion at Trench Isolation Edge
- Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length
- Characterization of Corner-Induced Leakage Current of a Shallow Silicided n^+/p Junction for Quarter-Micron MOSFETs
- Study of Drain Contact Structure Dependent Deep Submicron MOSFET Reliability by Photon Emission Analysis