Lee S‐g | Korea Univ. Chungnam Kor

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著作論文

Trade-Off between Hot Carrier Effect and Current Driving Capability Due to Drain Contact Structures in Deep Submicron MOSFETs
Effects of Low Temperature Interlayer Dielectric Films on the Gate Oxide Quality of Deep Submicron MOSFET's
Effects of Low Temperature Interlayer Dielectric Films on the Gate Oxide Quality of Deep Submicron MOSFET's
Shallow Trench Isolation Characteristics with High-Density-Plasma Chemical Vapor Deposition Gap-Fill Oxide for Deep-Submicron CMOS Technologies
Characterization of Corner-Induced Leakage Current of a Shallow Silicided n^+/p Junction for Quarter-Micron MOSFETs
Study of Drain Contact Structure Dependent Deep Submicron MOSFET Reliability by Photon Emission Analysis
Impact of Nitrogen Implantation in Lightly Doped Drain(NIL)on Deep Sub-Micron CMOS Devices
The Impact of Nitrogen Implantation at LDD(NIL) on Deep Sub-Micron CMOS Devices

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