Lee Kye-nam | Advan. Tech. Lab. Lg Semicon Co. Ltd.
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概要
関連著者
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LEE Kye-Nam
Advan. Tech. Lab., LG Semicon Co., Ltd.
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Lee Kye-nam
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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LEE Young-Jong
Advanced Technology Laboratory., LG Semicon Co.
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Lee Y‐j
Samsung Electronics Co. Ltd. Kyunggi‐do Kor
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Lee Young-jong
Lg Semicon. Ltd.
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Lee Young-jong
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Young-jong
Advanced Technology Laboratory. Lg Semicon Co.
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Kwon Oh-kyong
Department Of Electrical Engineering Hanyang University
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LEE Hi-Deok
Advanced Technology Laboratory., LG Semicon Co.
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JEONG Ju-Young
Department of Electrical Engineering The University of Suwon
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EO Yungseon
Department of Electrical Engineering Hanyang University
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LEE Chang-Hyo
Department of Physics Hanyang University
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Lee sang-Gi
Dept. of Physics Hanyang Univ.
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Hwang Hyunsang
Advanced Technology Laboratory., LG Semicon Co.,
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Hwang Jeong-Mo
Advanced Technology Laboratory., LG Semicon Co.,
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Jeong Ju-Young
Dept. of Elec. Eng., The Univ. of Suwon.
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Kwon Oh-Kyong
Dept. of Elec. Eng., Hanyang Univ.
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Lee Chang-Hyo
Dept. of Physics Hanyang Univ.
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Kwon O‐k
Division Of Electrical And Computer Engineering Hanyang University
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Kwon Oh-keun
Semiconductor Process And Device Laboratory Dept. Of Electronic Engineering Chung-ang University
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Lee Hi-deok
R&d Division Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory Lg Semicon Co. Ltd.
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Lee Hi-deok
Advanced Technology Laboratory. Lg Semicon Co.
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Lee S‐g
Korea Univ. Chungnam Kor
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Hwang Hyun-sang
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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JUNG Jong-Wan
Advan. Tech. Lab., LG Semicon Co., Ltd.
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Lee Donghoon
Advansed Technology Laboratory. Lg Semicon Co.
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Hwang J‐m
Hyundai Microelectronics Co. Cheongju Kor
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Hwang Jeong-mo
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Hwang Jeong-mo
R&d Division Lg Semicon Co. Ltd.
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Hwang Jeong-mo
R&d Division Hyundai Microelectronics Co.
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Hwang Hyunsang
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
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Yang Dooyoung
Advanced Technology Department, ULSI Laboratory, LG Semicon Co., Ltd.
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EO Yungseon
Dept. of Elec. Eng., Hanyang Univ.
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Hwang Jeong-mo
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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Yang Dooyoung
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
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Hwang J.-m.
Hyundai Electronics Industries Co.ltd. Memory R&d Division
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Lee H‐d
Chungnam National Univ. Taejon Kor
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Lee Kye-nam
Advansed Technology Laboratory. Lg Semicon Co.
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Lee Kye-nam
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
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Jung Jong-wan
Advan. Tech. Lab. Lg Semicon Co. Ltd.
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BYUN JeongSoo
Advanced Technology Department, ULSI Laboratory, LG Semicon Co., Ltd.
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Byun Jeongsoo
Advanced Technology Department Ulsi Laboratory Lg Semicon Co. Ltd.
著作論文
- Characterization of Corner Induced Leakage Current in Shallow Silicided n^+/p Junction
- Study of Drain Contact Structure Dependent Deep Submicron MOSFET Reliability by Photon Emission Analysis
- Fluorine Induced Reliability Degradation of W-polycide Gate CMOS Device