JUNG Jong-Wan | Advan. Tech. Lab., LG Semicon Co., Ltd.

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概要

• JUNG Jong-Wanの詳細を見る
• 同名の論文著者
• Advan. Tech. Lab., LG Semicon Co., Ltd.の論文著者

関連著者

• LEE Hi-Deok

  Advanced Technology Laboratory., LG Semicon Co.

• LEE Young-Jong

  Advanced Technology Laboratory., LG Semicon Co.

• Hwang Jeong-Mo

  Advanced Technology Laboratory., LG Semicon Co.,

• Lee Hi-deok

  R&d Division Lg Semicon Co. Ltd.

• Lee Hi-deok

  Advanced Technology Laboratory Lg Semicon Co. Ltd.

• Lee Hi-deok

  Advanced Technology Laboratory. Lg Semicon Co.

• Hwang Hyun-sang

  Advan. Tech. Lab. Lg Semicon Co. Ltd.

• JUNG Jong-Wan

  Advan. Tech. Lab., LG Semicon Co., Ltd.

• LEE Kye-Nam

  Advan. Tech. Lab., LG Semicon Co., Ltd.

• Lee Y‐j

  Samsung Electronics Co. Ltd. Kyunggi‐do Kor

• Hwang J‐m

  Hyundai Microelectronics Co. Cheongju Kor

• Hwang Jeong-mo

  Hyundai Electronics Industries Co.ltd. Memory R&d Division

• Hwang Jeong-mo

  R&d Division Lg Semicon Co. Ltd.

• Hwang Jeong-mo

  R&d Division Hyundai Microelectronics Co.

• Lee Young-jong

  Lg Semicon. Ltd.

• Lee Young-jong

  Advanced Technology Laboratory Lg Semicon Co. Ltd.

• Lee Young-jong

  Advanced Technology Laboratory. Lg Semicon Co.

• Hwang Jeong-mo

  Advan. Tech. Lab. Lg Semicon Co. Ltd.

• Hwang J.-m.

  Hyundai Electronics Industries Co.ltd. Memory R&d Division

• Lee H‐d

  Chungnam National Univ. Taejon Kor

• Lee Kye-nam

  Advan. Tech. Lab. Lg Semicon Co. Ltd.

• Jung Jong-wan

  Advan. Tech. Lab. Lg Semicon Co. Ltd.

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著作論文

• Characterization of Corner Induced Leakage Current in Shallow Silicided n^+/p Junction

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