Lee Kyung-ho | Lg Semicon Co. Ltd.
スポンサーリンク
概要
関連著者
-
LEE Young-Jong
LG Semicon.,Ltd.
-
Jung J‐w
Hanyang Univ. Seoul Kor
-
Lee Kyung-ho
Lg Semicon Co. Ltd.
-
Lee Y‐j
Samsung Electronics Co. Ltd. Kyunggi‐do Kor
-
Son Jeong-hwan
Hyundai Electronics Industries Co. Ltd.
-
Lee Young-jong
Lg Semicon. Ltd.
-
Lee Young-jong
Advanced Technology Laboratory Lg Semicon Co. Ltd.
-
Jung Jong-wan
Hyundai Electronics Industries Co. Ltd.
-
JUNG Jong-Wan
LG Semicon Co., Ltd.
-
SON Jeong-Hwan
LG Semicon Co., Ltd.
-
Lee Young-jong
Advanced Technology Laboratory. Lg Semicon Co.
-
Son J‐h
Hyundai Electronics Industries Co. Ltd.
-
Cho W‐j
Lg Semicon Co. Ltd.
-
Cho Won-ju
Lg Semicon Co. Ltd.
-
Kim J‐m
Department Of Manufacturing Science Graduate School Of Engineering Osaka University
-
Kim Jong-min
Materials & Devices Lab. Samsung Advanced Institute Of Technology
-
Kim Jong-min
Hyundai Electronics Industries Co. Ltd.
-
KIM Jong-Min
LG Semicon Co., Ltd.
-
CHUNG Shin-Young
LG Semicon Co., Ltd.
-
KIM Hyun-Cheol
LG Semicon Co., Ltd.
-
Kim Hyun-cheol
Lg Semicon Co. Ltd.
-
Chung Shin-young
Lg Semicon Co. Ltd.
著作論文
- Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length
- Dependence of Reverse Narrow Width Effect and Sub-threshold Hump Characteristics on the Gate length