Non-Destructive Method for Measuring Cut-Off Frequency of a p-n Junction with a Chopped Photon Beam
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概要
- 論文の詳細を見る
A solar cell fabricated on a p-type polycrystalline Si wafer has been irradiated with a chopped photon beam emitted bv a light-emitting diode. The wavelengh of the beam is 559 nm. The chopping frequency of the beam is varied from 10 to 10,000 Hz, and a cut-off frequency of 130 Hz is obtained from the frequency dependence of the ac photovoltage, which is measured capacitively through a 15 μm-thick mylar film. The observed value agrees well with that obtained by the conventional method.
- 社団法人応用物理学会の論文
- 1981-12-05
著者
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HONMA Noriaki
Central Research Laboratory, Hitachi, Ltd.
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MUNAKATA Chusuke
Central Research Laboratory, Hitachi, Ltd.
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Honma Noriaki
Central Research Laboratory Hitachi Lid.
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Munakata Chusuke
Central Research Laboratory Hitachi Lid.
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Munakata Chusuke
Central Res. Lab. Hitachi Ltd.
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