MUNAKATA Chusuke | Central Research Laboratory, Hitachi, Ltd.
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概要
関連著者
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MUNAKATA Chusuke
Central Research Laboratory, Hitachi, Ltd.
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Munakata Chusuke
Central Res. Lab. Hitachi Ltd.
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Munakata Chusuke
Central Research Laboratory Hitachi Lid.
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HONMA Noriaki
Central Research Laboratory, Hitachi, Ltd.
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Honma Noriaki
Central Research Laboratory Hitachi Lid.
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Honma N
Central Research Laboratory Hitachi Ltd.
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Munakata C
Tohoku Inst. Technol. Sendai Jpn
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Shimizu H
Nihon Kesso Koogaku Co. Ltd. Gunma Jpn
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Shimizu Hirofumi
High-technology Research Center And Faculty Of Engineering Kansai University
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Shimizu Hirofumi
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Shimizu H
High-technology Research Center And Faculty Of Engineering Kansai University
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Itoh Hisayoshi
Institute Of Materials Science University Of Tsukuba
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Itoh H
Semiconductor Academic Research Center
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SHIMIZU Hirofumi
Semiconductor Design & Development Center, Hitachi, Ltd.
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Itoh Hitoshi
Semiconductor Academic Research Center
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ITOH Haruo
Central Research Laboratory, Hitachi Lid.
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Itoh Haruo
Central Research Laboratory Hitachi Ltd.
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Shimizu Hirofumi
Semiconductor & Integrated Circuits Division Hitachi Lid.
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SHIMIZU Hirofumi
Kofu Branch, Musashi Works, Hitachi Ltd.,
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YAGI Kunihiro
Central Research Laboratory, Hitachi, Ltd.
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Yagi Kunihiro
Central Research Laboratory Hitachi Ltd.
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Shimizu Hirofumi
Kofu Branch Musashi Works Of Hitachi Ltd
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HONDA Yukio
Central Research Laboratory, Hitachi Ltd.
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Shimizu H
National Inst. Materials And Chemical Res. Ibaraki Jpn
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MAEKAWA Akiji
Central Research Laboratory, Hitatchi Ltd.
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MIURA Yoji
Central Research Laboratory, Hitatchi Ltd.
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Miura Yoji
Central Research Laboratory Hitachi Ltd.
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Honda Yukio
Central Research Laboratory Hitachi Ltd.
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Maekawa Akiji
Central Research Laboratory Hitachi Ltd.
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Munakata Chusuke
Central Research Laboratory Hitachi Ltd.
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Yagi K
Tokyo Inst. Technol. Tokyo Jpn
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Shimizu Hideaki
Department Of Reaction Chemistry Faculty Of Engineering The University Of Tokyo
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SAITOU Norio
Central Research Laboratory, Hitachi, Ltd.
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Kohno Hideki
Central Research Laboratory Hitachi Ltd.
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Kohno Hideki
Central Research Laboratory Hitatchi Ltd.
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AOKI Shigeru
Central Research Laboratry, Hitachi Ltd.
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KOSAKA Yuji
Semiconductor Design & Development Center, Hitachi, Ltd.
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OTA Masaya
Kofu Branch of Musashi Works, Hitachi Ltd.,
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WARABISAKO Terunori
Central Research Laboratory
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Hayakawa Hajime
Device Development Center Hitachi Ltd.
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Shimizu Hirofumi
Semiconductor Design & Development Center Hitachi Ltd.
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OKAZAKI Shinji
Central Research Laboratory, Hitacti, Ltd.
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Ota Masaya
Kofu Branch Of Musashi Works Hitachi Ltd.
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Kosaka Yuji
Semiconductor Design & Development Center Hitachi Ltd.
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Saitou Norio
Central Research Laboratory Hitachi Ltd.
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Saitou Norio
Central Research Lab. Hitachi Ltd.
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Honma Noriaki
Central Research Laboratory Hitachi Ltd.
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Todokoro Hideo
Central Research Laboratory
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Todokoro Hideo
Central Research Laboratory Hitachi Ltd.
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Todokoro Hideo
Central Laboratory Hitachi Ltd. Kokubunji
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Okazaki Shinji
Central Research Laboratory Hitachi Ltd.
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Okazaki Shinji
Central Research Lab. Hitachi Ltd.
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TAMURA Hiroshi
Central Research Laboratory, Hitachi Ltd.
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NONOGAKI Saburo
Central Research Laboratory, Hitachi Ltd.
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Nonogaki Saburo
Central Research Laboratory Hitachi Ltd.
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OZAWA Masami
Central Research Laboratory, Hitachi, Ltd.
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Nishimatsu Shigeru
Central Research Laboratory, Hitachi, Ltd.
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Ozawa Masami
Central Research Laboratory Hitachi Ltd.
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Hayakawa H
Device Development Center Hitachi Ltd.
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SHIMIZU Hiromichi
Central Research Laboratory, Hitachi, Ltd.
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KINAMERI Kanji
Central Research Laboratory, Hitachi, Ltd.
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Munakata Chusuke
Central Research Laboratory Hitachi Ltd.:(present Address)department Of Electronics Tohoku Institute
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Nishimatsu Shigeru
Central Research Laboratory Hitachi Ltd.
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Nishimatsu Shigeru
Central Research Laboratory Hitachi Lid.
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Warabisako Terunori
Central Research Laboratory Hitachi Lid.
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Kinameri Kanji
Central Research Laboratory Hitachi Ltd.
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Shimizu Hiromichi
Central Research Laboratory Hitachi Ltd.
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Migitaka Masatoshi
Central Research Lab. Hitachi Ltd.
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Aoki Shigeru
Central Research Laboratory Hitachi Ltd.
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Aoki Shigeru
Central Research Laboratry Hitachi Ltd.
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Munakata Chusuke
Central Research Laboratory Hitachi Ltd.:(present Address)department Of Electronics Tohoku Institute
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Munakata Chusuke
Central Research Lab. Hitachi Ltd.
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Tamura Hiroshi
Central Research Laboratory Hitachi Ltd.
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NONOGAKI Saburo
Central Research Laboratory, Hitachi, Ltd.
著作論文
- Simplified AC Photovoltaic Measurermemt of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
- Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
- Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method : Techniques, Instrumentations and Measurement
- Nondestructive Observations of Surface Flaws and Contaminations in Silicon Wafers by Means of a Scanning Photon Microscope : Semiconductors and Semiconductor Devices
- Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method : Techniques, Instrumentations and Measurement
- Distortion of Electron-Beam-Recorded Patterns on a Photographic Plate due to Charge-Up
- A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium
- Nondestructive Measurement of Minority Carrier Lifetimes in Si Wafers Using Frequency Dependence of ac Photovoltages
- Measurement of Minority Carrier Lifetimes using AC Photovoltages Excited by Two Photon Beams of Different Wavelengths
- A Non-Destructive Method for Measuring Lifetimes for Minority Carriers in Semiconductor Wafers Using Frequency-Dependent ac Photovoltages
- A Photovoltaic Method for Evaluating Junction Characteristics Using Cut-Off Frequency
- Ac Surface Photovoltages in p-Type Silicon Wafers Oxidized in Water-Free and Wet Ambients
- Ac Surface Photovoltages in Strongly-Inverted Oxidized p-Type Silicon Wafers^*
- Fine Chromium Grating Directly Made by Irradiating Electron Beam
- Determination of Surface Charge and Interface Trap Densities in Naturally Oxidized n-Type Si wafers Using ae Surface Photovoltages
- Sample Thickness Dependence of Minority Carrier Lifetimes Measured Using an ac Photovoltaic Method
- Frequency-Dependent Photovoltage-Generating Areas in a Strongly-Inverted Oxidized p-Type Silicon Wafer
- Electron Beam Enhanced Surface Photovoltage
- Excitation-Power-Density Dependent ac Surface Photovoltages in Radiation-Damaged Si Wafer
- Non-Destructive Method for Measuring Cut-Off Frequency of a p-n Junction with a Chopped Photon Beam
- Confirmation of Aluminum-Induced Negative Charge in Thermally Oxidized Silicon Wafers Using AC Surface Photovoltage Method
- Effect of Aluminum on Ac Surface Photovoltages in Thermally Oxidized n-Type Silicon Wafers
- A Failure Analysis of a Gunn Diode with a Scanning Electron Microscope