Shimizu Hirofumi | High-technology Research Center And Faculty Of Engineering Kansai University

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著作論文

Superconducting Properties of Ba-Y-Cu-O Tape Prepared by the Doctor Blade Process : Electrical Properties of Condensed Matter
Magnetic Properties and Upper Critical Fields of Sintered Tl-Ca-Ba-Cu-O Supercouiductors : Electrical Properties of Condensed Matter
Upper Critical Field of New Oxide Superconductor Bi-Sr-Ca-Cu-O : Electrical Properties of Condensed Matter
Simplified AC Photovoltaic Measurermemt of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method : Techniques, Instrumentations and Measurement
Nondestructive Observations of Surface Flaws and Contaminations in Silicon Wafers by Means of a Scanning Photon Microscope : Semiconductors and Semiconductor Devices
Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method : Techniques, Instrumentations and Measurement
Sensitivity of Ion-Imaging Method and Mass Analysis using an Imaging Detector
Direct Estimation of the Ionization Region for XHV Measurement by Laser Ionization
Pressure Measurement by Photoelectron Counting
Pressure Measurement in XHV Region Using Nonresonant Multiphoton Ionization by Picosecond Pulsed Laser
Excimer Laser Ablation of Cryogenic NO_2 Films
Direct Imaging of Spatial Distribution of Ions Generated by Nonresonant Multiphoton Ionization of H_2 Gas
Preliminary Pressure Measurement in the Range of 10^ Pa Using a Picosecond Pulsed Laser
Nonresonant Multiphoton Ionization of H_2, CO and CO_2 by Second Harmonics of Picosecond YAG Laser
Measurement of Extreme-High-Vacuum Pressure by Laser Ionization
Multiphoton Ionization of Xe and Kr Atoms by an ArF Excimer Laser
A New Ion Counting System Devised for Mass-Selective Detection of Sputtered Neutrals in Laser SNMS
Nonresonant Multiphoton Ionization of He and Ne Atoms
Dependence of the Nonresonant Laser Ionization of Rare Gases on Laser Wavelength
Detection of Sputtered Neutral Atoms by Nonresonant Multiphoton Ionization : Surfaces, Interfaces and Films
Preliminary Results of Vacuum Pressure Measurement by Laser Ionization Method
Tape Conductor Fabrication Process for High-T_c Ba_2YCu_3O_ : Electrical Properties of Condensed Matter
Excellence of Gate Oxide Integrity in Metal-Oxide-Semiconductor Large-Scale-Integrated Circuits Based on P^-/P^- Thin-Film Epitaxial Silicon Wafers
Dependence of Warpage of Czochralski-Grown Silicon Wafers on Oxygen Concentration and Its Application to MOS Image-Sensor Device
Estimation of Epitaxial Temperature Using X-Ray Diffraction for Si Films Grown on (100) Si by Molecular Beam Epitaxy
X-Ray Diffraction from Low-Temperature-Grown Silicon Films with Small Surface Roughness
Main Cause of Surface Waveguides Formed under LiNbO_3 Crystal Surface during Thermal Treatment
Adsorption and Thermal or Photodecomposition of Triethylgallium and Trimethylgallium on Si(111)-7×7
Prevention of Thermal Degradations by Using Dehydrated LiNbO_3 Crystal
Analysis of the Thickness Edge Mode in Piezoelectric Plates and Its Application to Resonators
Photochemical Decomposition of Triethylgallium on Si(111) Studied by Means of STM, LEED, AES and Mass Spectroscopy
Oxidation-Induced Stacking Faults Dependent on Oxygen Concentration in Czochralski-Growrn Silicon Wafers
Optimum Electrode Design for Effective Excitation of the Edge Mode by Taking Account of Its Electric Potential Distribution : SAW and Communication Device
Gold Substrates for Scanning Tunneling Microscopy of Adsorbed Species

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