Sugino Yuji | Kofu Operation Of Semiconductor And Integrated Circuits Division Hitachi Ltd.
スポンサーリンク
概要
関連著者
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Shimizu H
Nihon Kesso Koogaku Co. Ltd. Gunma Jpn
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Fujita Masato
Kofu Operation Of Semiconductor And Integrated Circuits Division Hitachi Ltd.
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SUGINO Yuji
Kofu, Operation of Semiconductor and Integrated Circuits Division, Hitachi Ltd.
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Shimizu Hirofumi
High-technology Research Center And Faculty Of Engineering Kansai University
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Shimizu Hirofumi
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Sugino Yuji
Kofu Operation Of Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Shimizu H
High-technology Research Center And Faculty Of Engineering Kansai University
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Fujita M
Shizuoka Univ. Shizuoka Jpn
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Nagasawa K
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Nagasawa Koichi
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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SHIMIZU Hirofumi
Semiconductor Design & Development Center, Hitachi, Ltd.
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SHIMIZU Hirofumi
Kofu Branch, Musashi Works, Hitachi Ltd.,
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Shimizu H
National Inst. Materials And Chemical Res. Ibaraki Jpn
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TAKEDA Kazuo
Central Research Lab., Hitachi, Lid.
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ISOMAE Seiichi
Central Research Lab., Hitachi, Lid.
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Takeda K
Hitachi Ltd. Tokyo Jpn
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SUZUKI Norio
Semiconductor and Integrated Circuits Division, Hitachi Ltd.
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KIYOTA Shogo
Semiconductor and Integrated Circuits Division, Hitachi Ltd.
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FUJITA Masato
Kofu, Operation of Semiconductor and Integrated Circuits Division, Hitachi Ltd.
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AOSHIMA Takaaki
Musashi Works of Hitachi Ltd.
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SUGINO Yuji
Kofu Branch, Musashi Works of Hitachi Lid.
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Kiyota Shogo
Semiconductor And Integrated Circuits Division Hitachi Ltd.
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Shimizu Hideaki
Department Of Reaction Chemistry Faculty Of Engineering The University Of Tokyo
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Shimizu Hirofumi
Kofu Branch Musashi Works Of Hitachi Ltd
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Shimizu Hirofumi
Semiconductor & Integrated Circuits Division Hitachi Lid.
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Takeda Kazuo
Central Research Laboratory Hitachi Ltd.
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Takeda Kazuo
Central Research Lab. Hitachi Ltd.
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Suzuki Norio
Semiconductor And Integrated Circuits Division Hitachi Ltd.
著作論文
- Excellence of Gate Oxide Integrity in Metal-Oxide-Semiconductor Large-Scale-Integrated Circuits Based on P^-/P^- Thin-Film Epitaxial Silicon Wafers
- Dependence of Warpage of Czochralski-Grown Silicon Wafers on Oxygen Concentration and Its Application to MOS Image-Sensor Device