Shimizu H | National Inst. Materials And Chemical Res. Ibaraki Jpn

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概要

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著作論文

Simplified AC Photovoltaic Measurermemt of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
Sensitivity of Ion-Imaging Method and Mass Analysis using an Imaging Detector
Direct Estimation of the Ionization Region for XHV Measurement by Laser Ionization
Pressure Measurement by Photoelectron Counting
Pressure Measurement in XHV Region Using Nonresonant Multiphoton Ionization by Picosecond Pulsed Laser
Excimer Laser Ablation of Cryogenic NO_2 Films
Direct Imaging of Spatial Distribution of Ions Generated by Nonresonant Multiphoton Ionization of H_2 Gas
Preliminary Pressure Measurement in the Range of 10^ Pa Using a Picosecond Pulsed Laser
Nonresonant Multiphoton Ionization of H_2, CO and CO_2 by Second Harmonics of Picosecond YAG Laser
Measurement of Extreme-High-Vacuum Pressure by Laser Ionization
Multiphoton Ionization of Xe and Kr Atoms by an ArF Excimer Laser
A New Ion Counting System Devised for Mass-Selective Detection of Sputtered Neutrals in Laser SNMS
Nonresonant Multiphoton Ionization of He and Ne Atoms
Dependence of the Nonresonant Laser Ionization of Rare Gases on Laser Wavelength
Detection of Sputtered Neutral Atoms by Nonresonant Multiphoton Ionization : Surfaces, Interfaces and Films
Preliminary Results of Vacuum Pressure Measurement by Laser Ionization Method
Excellence of Gate Oxide Integrity in Metal-Oxide-Semiconductor Large-Scale-Integrated Circuits Based on P^-/P^- Thin-Film Epitaxial Silicon Wafers
Estimation of Epitaxial Temperature Using X-Ray Diffraction for Si Films Grown on (100) Si by Molecular Beam Epitaxy
X-Ray Diffraction from Low-Temperature-Grown Silicon Films with Small Surface Roughness
Main Cause of Surface Waveguides Formed under LiNbO_3 Crystal Surface during Thermal Treatment
Adsorption and Thermal or Photodecomposition of Triethylgallium and Trimethylgallium on Si(111)-7×7
Prevention of Thermal Degradations by Using Dehydrated LiNbO_3 Crystal
Photochemical Decomposition of Triethylgallium on Si(111) Studied by Means of STM, LEED, AES and Mass Spectroscopy
Oxidation-Induced Stacking Faults Dependent on Oxygen Concentration in Czochralski-Growrn Silicon Wafers
Gold Substrates for Scanning Tunneling Microscopy of Adsorbed Species

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