Munakata C | Tohoku Inst. Technol. Sendai Jpn

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概要

• 同名の論文著者
• Tohoku Inst. Technol. Sendai Jpnの論文著者

関連著者

• HONMA Noriaki

  Central Research Laboratory, Hitachi, Ltd.

• MUNAKATA Chusuke

  Central Research Laboratory, Hitachi, Ltd.

• Honma N

  Central Research Laboratory Hitachi Ltd.

• Honma Noriaki

  Central Research Laboratory Hitachi Lid.

• Munakata C

  Tohoku Inst. Technol. Sendai Jpn

• Munakata Chusuke

  Central Research Laboratory Hitachi Lid.

• Munakata Chusuke

  Central Res. Lab. Hitachi Ltd.

• Shimizu H

  Nihon Kesso Koogaku Co. Ltd. Gunma Jpn

• Shimizu Hirofumi

  High-technology Research Center And Faculty Of Engineering Kansai University

• Shimizu Hirofumi

  Semiconductor And Integrated Circuits Division Hitachi Ltd.

• Shimizu H

  High-technology Research Center And Faculty Of Engineering Kansai University

• Itoh Hisayoshi

  Institute Of Materials Science University Of Tsukuba

• Itoh H

  Semiconductor Academic Research Center

• Itoh Hitoshi

  Semiconductor Academic Research Center

• ITOH Haruo

  Central Research Laboratory, Hitachi Lid.

• Itoh Haruo

  Central Research Laboratory Hitachi Ltd.

• SHIMIZU Hirofumi

  Kofu Branch, Musashi Works, Hitachi Ltd.,

• Shimizu Hirofumi

  Kofu Branch Musashi Works Of Hitachi Ltd

• SHIMIZU Hirofumi

  Semiconductor Design & Development Center, Hitachi, Ltd.

• Shimizu H

  National Inst. Materials And Chemical Res. Ibaraki Jpn

• YAGI Kunihiro

  Central Research Laboratory, Hitachi, Ltd.

• Yagi K

  Tokyo Inst. Technol. Tokyo Jpn

• Yagi Kunihiro

  Central Research Laboratory Hitachi Ltd.

• Shimizu Hideaki

  Department Of Reaction Chemistry Faculty Of Engineering The University Of Tokyo

• Shimizu Hirofumi

  Semiconductor & Integrated Circuits Division Hitachi Lid.

• AOKI Shigeru

  Central Research Laboratry, Hitachi Ltd.

• KOSAKA Yuji

  Semiconductor Design & Development Center, Hitachi, Ltd.

• OTA Masaya

  Kofu Branch of Musashi Works, Hitachi Ltd.,

• WARABISAKO Terunori

  Central Research Laboratory

• Ota Masaya

  Kofu Branch Of Musashi Works Hitachi Ltd.

• Kosaka Yuji

  Semiconductor Design & Development Center Hitachi Ltd.

• TAMURA Hiroshi

  Central Research Laboratory, Hitachi Ltd.

• OZAWA Masami

  Central Research Laboratory, Hitachi, Ltd.

• Nishimatsu Shigeru

  Central Research Laboratory, Hitachi, Ltd.

• Ozawa Masami

  Central Research Laboratory Hitachi Ltd.

• Nishimatsu Shigeru

  Central Research Laboratory Hitachi Ltd.

• Nishimatsu Shigeru

  Central Research Laboratory Hitachi Lid.

• Warabisako Terunori

  Central Research Laboratory Hitachi Lid.

• Aoki Shigeru

  Central Research Laboratory Hitachi Ltd.

• Aoki Shigeru

  Central Research Laboratry Hitachi Ltd.

• Tamura Hiroshi

  Central Research Laboratory Hitachi Ltd.

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著作論文

• Simplified AC Photovoltaic Measurermemt of Minority Carrier Lifetime in Czochralski-Grown Silicon Wafers Having Ring-Distributed Stacking Faults
• Observation of Ring-Distributed Microdefects in Czochralski-Grown Silicon Wafers with a Scanning Photon Microscope and Its Diagnostic Application to Device Processing
• Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method : Techniques, Instrumentations and Measurement
• Nondestructive Observations of Surface Flaws and Contaminations in Silicon Wafers by Means of a Scanning Photon Microscope : Semiconductors and Semiconductor Devices
• Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method : Techniques, Instrumentations and Measurement
• Nondestructive Measurement of Minority Carrier Lifetimes in Si Wafers Using Frequency Dependence of ac Photovoltages
• Measurement of Minority Carrier Lifetimes using AC Photovoltages Excited by Two Photon Beams of Different Wavelengths
• A Non-Destructive Method for Measuring Lifetimes for Minority Carriers in Semiconductor Wafers Using Frequency-Dependent ac Photovoltages
• A Photovoltaic Method for Evaluating Junction Characteristics Using Cut-Off Frequency
• Ac Surface Photovoltages in p-Type Silicon Wafers Oxidized in Water-Free and Wet Ambients
• Ac Surface Photovoltages in Strongly-Inverted Oxidized p-Type Silicon Wafers^*

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