A Failure Analysis of a Gunn Diode with a Scanning Electron Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1971-02-05
著者
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MUNAKATA Chusuke
Central Research Laboratory, Hitachi, Ltd.
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Migitaka Masatoshi
Central Research Lab. Hitachi Ltd.
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Munakata Chusuke
Central Res. Lab. Hitachi Ltd.
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