A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1966-03-15
著者
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MUNAKATA Chusuke
Central Research Laboratory, Hitachi, Ltd.
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Todokoro Hideo
Central Research Laboratory
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Todokoro Hideo
Central Research Laboratory Hitachi Ltd.
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Todokoro Hideo
Central Laboratory Hitachi Ltd. Kokubunji
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Munakata Chusuke
Central Research Lab. Hitachi Ltd.
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Munakata Chusuke
Central Res. Lab. Hitachi Ltd.
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