Die Verteilung des durch einen Elektronenstrahl ionisierten Ionenstromes im Elektronenstrahl-Apparate
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1966-03-15
著者
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WATANABE Hiroshi
Central Research Lab. Hitachi Ltd.
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Munakata Chusuke
Central Research Lab. Hitachi Ltd.
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Munakata Chusuke
Central Res. Lab. Hitachi Ltd.
関連論文
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- Comparison of Minority Carrier Lifetimes Measured by Photoconductive Decay and ac Photovoltaic Method : Techniques, Instrumentations and Measurement
- Nondestructive Observations of Surface Flaws and Contaminations in Silicon Wafers by Means of a Scanning Photon Microscope : Semiconductors and Semiconductor Devices
- Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method : Techniques, Instrumentations and Measurement
- Distortion of Electron-Beam-Recorded Patterns on a Photographic Plate due to Charge-Up
- A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium
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- Ac Surface Photovoltages in Strongly-Inverted Oxidized p-Type Silicon Wafers^*
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- Frequency-Dependent Photovoltage-Generating Areas in a Strongly-Inverted Oxidized p-Type Silicon Wafer
- Electron Beam Enhanced Surface Photovoltage
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- Confirmation of Aluminum-Induced Negative Charge in Native Silicon Dioxide
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- Bulk Electron Voltaic Effect
- A Very Low Electron Temperature Mercury Plasma
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- Effects of Dipping in an Aqueous Hydrofluoric Acid Solution before Oxidation on Minority Carrier Lifetimes in p-Type Silicon Wafers
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