Characteristics of Bismuth Layered SrBi_2Ta_2O_9 Thin-Film Capacitors and Comparison with Pb(Zr, Ti)O_3
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1995-09-30
著者
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Paz De
University Of Colorado At Colorado Springs And Symetrix Corporation
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WATANABE Hideyuki
Diamond Research Center, National Institute of Advanced Industrial Science and Technology (AIST)
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Watanabe Hirohito
Institute Of Material Science University Of Tsukuba
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Watanabe H
Diamond Research Center National Institute Of Advanced Industrial Science And Technology (aist)
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Watanabe H
Semiconductor Leading Edge Technol. Inc. Yokohama Jpn
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WATANABE Hitoshi
Basic Research Dept., Corporate Research Div., Olympus Optical Co., Ltd.
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MIHARA Takashi
Basic Research Dept., Corporate Research Div., Olympus Optical Co., Ltd.
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YOSHIMORI Hiroyuki
Basic Research Dept., Corporate Research Div., Olympus Optical Co., Ltd.
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Yoshimori Hiroyuki
Applied Research Dept., Corporate Research Division, Olympus Optical Corp., Ltd.
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WATANABE Hajime
ULSI Laboratory, Mitsubishi Electric Corporation
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Mihara T
National Institute Of Advanced Industrial Science And Technology
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Yoshimori Hiroyuki
Applied Research Dept. Corporate Research Division Olympus Optical Corp. Ltd.
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Watanabe Hideo
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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