Cross Sectional Transmission Electron Microscopy of Zn Diffusion Induced Disordering of GaAlAs-GaAs Multiquantum-Well Structures
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1985-08-20
著者
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Ishida Koichi
Optoelectronics Joint Research Laboratory:(present Address) Fundamental Research Laboratories Nec Co
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Ishida Koichi
Optoelectronics Joint Research Laboratory
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NAKASHIMA Hisao
Optoelectronics Joint Research Laboratory
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Ohta Tsuneaki
Optoelectronics Joint Research Laboratory
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Ohta Tuneaki
Oki Electric Industry Co. Ltd.
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Ohta Tsuneaki
Oki Ekectric Industry Co. Ltd.
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Ohta Tsuneaki
Oki Electric Industry Co. Ltd.
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Ohta T
Matsushita Electric Industrial Co. Ltd. Osaka Jpn
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Nakashima Hideharu
Interdisciplinary Graduate School Of Engineering Sciences Kyushu University
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Semura Shigeru
Optoelectronics Joint Research Laboratory
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Nakashima H
Osaka Univ. Osaka Jpn
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Semura Shigeru
Transmission Media R&d Department Yokohama Research Laboratories Sumitomo Electric Industries
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