Characterization of Lattice Defect Structures at GaAs/Si Interface by Transmission Electron Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1986-04-20
著者
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Akiyama M
Kyushu National Industrial Research Institute Agency Of Industrial Science And Technology Ministry O
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Ishida Koichi
Optoelectronics Joint Research Laboratory:(present Address) Fundamental Research Laboratories Nec Co
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Ishida Koichi
Optoelectronics Joint Research Laboratory
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Nishi S
Oki Electric Ind. Co. Ltd. Yokosuka‐shi Jpn
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Nishi Seiji
Research Laboratory Oki Electric Industry Co. Ltd.
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Akiyama Masahiro
Research Laboratory Oki Electric Industry Co. Ltd.
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Akiyama Masahiro
Semiconductor Technology Laboratory Oki Electric Industry Co. Ltd.
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Akiyama Masahiro
Research And Development Group Oki Electric Industry Co. Ltd.
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Ishida K
Taiyo Yuden Co. Ltd.
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NISHI Seiji
Department of Physics, Osaka University
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石田 謙司
神戸大学 大学院工学研究科
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