Stress Distribution Analysis in Structured GaAs Layers Fabricated on Si Substrates

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1990-06-20

著者

• Wada Naoki

  Department of Applied Chemistry, The University of Tokyo

• SAKAI Shiro

  Department of Electrical and Electronic Engineering, University of Tokushima

• Sakai S

  Tokushima Univ. Tokushima Jpn

• Sakai S

  Department Of Electric And Computer Engineering Nagoya Institute Of Technology

• Sakai S

  Department Of Electrical And Electronic Engineering The University Of Tokushinna

• Sakai S

  Electrotechnical Lab. Ibaraki

• Wada Naoki

  Department Of Electrical And Electronic Engineering Tokushima University

• Wada Naoki

  Department Of Electrical Engineering And Electronics College Of Engineering Osaka Sangyo University

• Wada Naoki

  Department Of Electric And Electronic Engineering University Of Tokushima:matsushita Kotobuki Electr

• Wada Naoki

  Department Of Applied Chemistry The University Of Tokyo

• KAWASAKI Koji

  Department of Electric and Electronic Engineering, University of Tokushima

• Kawasaki K

  Tokyo Inst. Technol. Yokohama Jpn

• Sakai Shiro

  Graduate School Of Engineering The University Of Tokushima

• Sakai Shiro

  Department Of Electrical And Electronic Engineering The University Of Tokushima

• Sakai S

  Faculty Of Education Shinshu University:(present Address)department Of Materials Science And Chemica

• Kawasaki Koji

  Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology

• Kawasaki Koji

  Department Of Preventive And Community Dentistry Osaka Dental University

• Kawasaki Koji

  Department Of Electric And Electronic Engineering University Of Tokushima

• Sakai Shiro

  Department Of Electrical And Computer Engineering Nagoya Institute Of Technology

• Kawasaki Koji

  Department Of Applied Electronics Interdesciplinary Graduate School Of Science And Engineering Tokyo

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