New Mechanisms and the Characterization of Plasma Charging Enhanced Hot Carrier Effect in Deep-Submicron N-MOSFET's

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概要

• 論文の詳細を見る
• 2000-08-28

著者

• Chen S.

  Department Of Electronic Engineering National Chiao Tung University

• Chang C.

  Department Of Electronic Engineering National Chiao Tung University

• Chang C.

  Department Of Anatomy Taipei Medical University

• Chung Steve

  Department Of Electrical Engineering National Tsing-hua University

• KAO H.

  Department of Chemistry, Tamkang University

• Chen C.

  Department Of Electrical Engineering National Central University

• LIN H.

  National Nano Device Lab.

• Chen C.

  Department Of Electronic Engineering National Chiao Tung University

• Chen C.

  Department Of Aeronautics And Astronautics National Cheng-kung University

• Kao H.

  Department Of Chemistry Tamkang University

• Kao H.

  Department Of Electronic Engineering National Chiao Tung University

• CHANG C.

  Department of Electronic Engineering, National Chiao Tung University

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