Analysis of Structure-Dependent Hot Carrier Effect in Various LDD MOSFET's Using an Efficient Interface State Profiling Method
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概要
- 論文の詳細を見る
- 1995-08-21
著者
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Chung Steve
Department Of Electrical Engineering National Tsing-hua University
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Yang J.-j.
Department Of Electronic Engineering National Chiao Tung University
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Chen C.-h.
Taiwan Semiconductor Manufacturing Co.
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CHOU P.-C.
Department of Electronic Engineering, National Chiao Tung University
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SHIH J.-R.
Taiwan Semiconductor Manufacturing Co.
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LIN M.-S.
Taiwan Semiconductor Manufacturing Co.
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Chou P.-c.
Department Of Electronic Engineering National Chiao Tung University
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