A New Observation of the Width Dependent Hot Carrier Effect in Shallow-Trench-Isolated P-MOSFET's
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概要
- 論文の詳細を見る
- 1999-09-20
著者
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CHUNG Steve
Department of Electronic Engineering, National Chiao Tung University
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Chung Steve
Department Of Electrical Engineering National Tsing-hua University
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Yih C.-m.
Department Of Electronic Engineering National Chiao Tung University
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YANG W.-J.
Department of Electronic Engineering, National Chiao Tung University
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YANG J.-J.
Worldwide Semiconductor Manufacturing Co.
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Yang W.-j.
Department Of Electronic Engineering National Chiao Tung University
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